METROLOGY APPARATUS TO FACILITATE CAPTURE OF METROLOGY DATA

In the present disclosure, systems and apparatuses for stabilizing a metrology device may be provided. The metrology device may be connected with a metrology apparatus that may prevent and/or correct for unintended movement of the metrology device. The metrology apparatus may include a base plate ha...

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description In the present disclosure, systems and apparatuses for stabilizing a metrology device may be provided. The metrology device may be connected with a metrology apparatus that may prevent and/or correct for unintended movement of the metrology device. The metrology apparatus may include a base plate having a top surface and a bottom surface, and the base plate may include a plurality of holes from the top surface to the bottom surface. The metrology apparatus may further include a plurality of suspension rods, and a distal end of a respective suspension rod may be positioned through a respective hole such that a first portion of the distal end is disposed on the top surface of the base plate and a second portion of the distal end is disposed on the bottom surface of the base plate. The metrology device may be connected to the bottom surface of the base plate such that at least a portion of an assembly cell is within a field of view of the metrology device.
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The metrology device may be connected with a metrology apparatus that may prevent and/or correct for unintended movement of the metrology device. The metrology apparatus may include a base plate having a top surface and a bottom surface, and the base plate may include a plurality of holes from the top surface to the bottom surface. The metrology apparatus may further include a plurality of suspension rods, and a distal end of a respective suspension rod may be positioned through a respective hole such that a first portion of the distal end is disposed on the top surface of the base plate and a second portion of the distal end is disposed on the bottom surface of the base plate. The metrology device may be connected to the bottom surface of the base plate such that at least a portion of an assembly cell is within a field of view of the metrology device.</abstract><oa>free_for_read</oa></addata></record>
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subjects ADDITIVE MANUFACTURING TECHNOLOGY
ADDITIVE MANUFACTURING, i.e. MANUFACTURING OFTHREE-DIMENSIONAL [3-D] OBJECTS BY ADDITIVE DEPOSITION, ADDITIVEAGGLOMERATION OR ADDITIVE LAYERING, e.g. BY 3-D PRINTING,STEREOLITHOGRAPHY OR SELECTIVE LASER SINTERING
AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
BLASTING
CASTING
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
ENGINEERING ELEMENTS AND UNITS
FRAMES, CASINGS, OR BEDS OF ENGINES OR OTHER MACHINES ORAPPARATUS NOT SPECIFIC TO AN ENGINE, MACHINE, OR APPARATUSPROVIDED FOR ELSEWHERE
GENERAL MEASURES FOR PRODUCING AND MAINTAINING EFFECTIVEFUNCTIONING OF MACHINES OR INSTALLATIONS
HEATING
LIGHTING
MAKING METALLIC POWDER
MANUFACTURE OF ARTICLES FROM METALLIC POWDER
MEANS FOR DAMPING VIBRATION
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
MECHANICAL ENGINEERING
PERFORMING OPERATIONS
PHYSICS
PICTORIAL COMMUNICATION, e.g. TELEVISION
POWDER METALLURGY
SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDEDFOR
SHAPING OR JOINING OF PLASTICS
SHOCK-ABSORBERS
SPRINGS
STANDS OR SUPPORTS
TARIFF METERING APPARATUS
TESTING
THERMAL INSULATION IN GENERAL
TRANSPORTING
WEAPONS
WORKING METALLIC POWDER
WORKING OF PLASTICS
WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
title METROLOGY APPARATUS TO FACILITATE CAPTURE OF METROLOGY DATA
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