MOLDED ARTICLE AND METHOD FOR PRODUCING SAME
There is provided a molded article containing an amorphous resin, wherein a peak position change rate r (%) of the molded article defined by Equation: Peak position change rate r (%) = 100 × (Q1-Q2)/Q2 is 1 or more. In the equation, Q1 and Q2 are peak positions (nm-1) of the molded article and a pre...
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creator | BANDO, Akinori KADOYA, Hidenori TAKAGI, Yasuyuki YASUTOMI, Yoichi |
description | There is provided a molded article containing an amorphous resin, wherein a peak position change rate r (%) of the molded article defined by Equation: Peak position change rate r (%) = 100 × (Q1-Q2)/Q2 is 1 or more. In the equation, Q1 and Q2 are peak positions (nm-1) of the molded article and a predetermined reference molded article, respectively, the peak position being determined by a wide angle X-ray diffraction method. The peak position is a peak derived from the amorphous resin in a scattering vector magnitude Q-intensity profile calculated from a diffraction image obtained by a transmission method and measured by the wide angle X-ray diffraction method and obtained after background correction and transmittance correction, and the peak position is a value of Q at a peak at which Q is the smallest among peaks at which Q is in a range of 5 nm-1 to 25 nm-1. |
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In the equation, Q1 and Q2 are peak positions (nm-1) of the molded article and a predetermined reference molded article, respectively, the peak position being determined by a wide angle X-ray diffraction method. The peak position is a peak derived from the amorphous resin in a scattering vector magnitude Q-intensity profile calculated from a diffraction image obtained by a transmission method and measured by the wide angle X-ray diffraction method and obtained after background correction and transmittance correction, and the peak position is a value of Q at a peak at which Q is the smallest among peaks at which Q is in a range of 5 nm-1 to 25 nm-1.</description><language>eng ; fre ; ger</language><subject>AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G ; CHEMISTRY ; COMPOSITIONS BASED THEREON ; GENERAL PROCESSES OF COMPOUNDING ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; METALLURGY ; ORGANIC MACROMOLECULAR COMPOUNDS ; PHYSICS ; TESTING ; THEIR PREPARATION OR CHEMICAL WORKING-UP ; WORKING-UP</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210922&DB=EPODOC&CC=EP&NR=3882302A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210922&DB=EPODOC&CC=EP&NR=3882302A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BANDO, Akinori</creatorcontrib><creatorcontrib>KADOYA, Hidenori</creatorcontrib><creatorcontrib>TAKAGI, Yasuyuki</creatorcontrib><creatorcontrib>YASUTOMI, Yoichi</creatorcontrib><title>MOLDED ARTICLE AND METHOD FOR PRODUCING SAME</title><description>There is provided a molded article containing an amorphous resin, wherein a peak position change rate r (%) of the molded article defined by Equation: Peak position change rate r (%) = 100 × (Q1-Q2)/Q2 is 1 or more. 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In the equation, Q1 and Q2 are peak positions (nm-1) of the molded article and a predetermined reference molded article, respectively, the peak position being determined by a wide angle X-ray diffraction method. The peak position is a peak derived from the amorphous resin in a scattering vector magnitude Q-intensity profile calculated from a diffraction image obtained by a transmission method and measured by the wide angle X-ray diffraction method and obtained after background correction and transmittance correction, and the peak position is a value of Q at a peak at which Q is the smallest among peaks at which Q is in a range of 5 nm-1 to 25 nm-1.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F,C08G CHEMISTRY COMPOSITIONS BASED THEREON GENERAL PROCESSES OF COMPOUNDING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING METALLURGY ORGANIC MACROMOLECULAR COMPOUNDS PHYSICS TESTING THEIR PREPARATION OR CHEMICAL WORKING-UP WORKING-UP |
title | MOLDED ARTICLE AND METHOD FOR PRODUCING SAME |
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