PROCESSING APPARATUS, SYSTEM, X-RAY MEASUREMENT METHOD, AND PROGRAM

There are provided a storage section 220 that stores an output value read out by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and a calculation section 230 that calculates a count value based on the output value that has been read out, wherein the cal...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SAKUMA, Yasutaka, KOBAYASHI, Shintaro, SAKUMURA, Takuto, NAKAE, Yasukazu
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!