PROCESSING APPARATUS, SYSTEM, X-RAY MEASUREMENT METHOD, AND PROGRAM

There are provided a storage section 220 that stores an output value read out by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and a calculation section 230 that calculates a count value based on the output value that has been read out, wherein the cal...

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Hauptverfasser:	SAKUMA, Yasutaka, KOBAYASHI, Shintaro, SAKUMURA, Takuto, NAKAE, Yasukazu
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
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creator	SAKUMA, Yasutaka KOBAYASHI, Shintaro SAKUMURA, Takuto NAKAE, Yasukazu
description	There are provided a storage section 220 that stores an output value read out by counting a pulse signal of incident X-rays, by a photon-counting type semiconductor detector; and a calculation section 230 that calculates a count value based on the output value that has been read out, wherein the calculation section 230 uses a model in which an apparent time constant of the pulse signal monotonously decreases against increase in pulse detection ratio with respect to exposure. According to such a model, the corresponding apparent time constant is able to be obtained even in any higher count rate. As a result of this, reduced can be the influence of count loss even on the count rate that has not been able to be covered by the conventional method.
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subjects	MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
title	PROCESSING APPARATUS, SYSTEM, X-RAY MEASUREMENT METHOD, AND PROGRAM
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