METHOD AND SYSTEM FOR TEST CASE GENERATION FOR EVENT BASED SYSTEMS USING GRAPH PATH TRAVERSAL

Product testing ensures whether the product is defect free or not and it is an important part of any product before product release. Any inadequacy in testing can result in financial losses and also damage the reputation, brand, and business. Functional testing is important since it verifies that th...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: ZARE, Amey, SHROTRI, Ulka, RAMANATHAN, Venkatesh, VERMA, SagarKumar, AGRAWAL, Supriya
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator ZARE, Amey
SHROTRI, Ulka
RAMANATHAN, Venkatesh
VERMA, SagarKumar
AGRAWAL, Supriya
description Product testing ensures whether the product is defect free or not and it is an important part of any product before product release. Any inadequacy in testing can result in financial losses and also damage the reputation, brand, and business. Functional testing is important since it verifies that the products functioning meets its requirements. Conventional methods mainly focus on executing test cases rather than generating test cases. Hence there is challenge to create scalable test cases for products with huge volume of data and with complex features. The present disclosure generates a plurality of time bound test cases based on an Artificial Rain Drop (ARD) algorithm. Here, events associated with an event based system are compiled in a tabular format. Each of the plurality of events are represented as a regular expression. Further, timed finite automaton is constructed for each regular expression prior to applying the ARD algorithm.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3792787A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3792787A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3792787A13</originalsourceid><addsrcrecordid>eNqNyjEKwkAQRuE0FqLe4b-AhaaIlmMy2Q2Y3bAzCVhICLJWooF4fxTR3uoV35sn55rV-gLkCshJlGuUPkBZFDkJw7DjQFp59wHu2CkOb_n9glYqZ2ACNRYNqYUG6jgIHZfJ7Drcprj6dpGgZM3tOo6PPk7jcIn3-Oy5SbP9NttltEn_WF54XTJD</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>METHOD AND SYSTEM FOR TEST CASE GENERATION FOR EVENT BASED SYSTEMS USING GRAPH PATH TRAVERSAL</title><source>esp@cenet</source><creator>ZARE, Amey ; SHROTRI, Ulka ; RAMANATHAN, Venkatesh ; VERMA, SagarKumar ; AGRAWAL, Supriya</creator><creatorcontrib>ZARE, Amey ; SHROTRI, Ulka ; RAMANATHAN, Venkatesh ; VERMA, SagarKumar ; AGRAWAL, Supriya</creatorcontrib><description>Product testing ensures whether the product is defect free or not and it is an important part of any product before product release. Any inadequacy in testing can result in financial losses and also damage the reputation, brand, and business. Functional testing is important since it verifies that the products functioning meets its requirements. Conventional methods mainly focus on executing test cases rather than generating test cases. Hence there is challenge to create scalable test cases for products with huge volume of data and with complex features. The present disclosure generates a plurality of time bound test cases based on an Artificial Rain Drop (ARD) algorithm. Here, events associated with an event based system are compiled in a tabular format. Each of the plurality of events are represented as a regular expression. Further, timed finite automaton is constructed for each regular expression prior to applying the ARD algorithm.</description><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210317&amp;DB=EPODOC&amp;CC=EP&amp;NR=3792787A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210317&amp;DB=EPODOC&amp;CC=EP&amp;NR=3792787A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZARE, Amey</creatorcontrib><creatorcontrib>SHROTRI, Ulka</creatorcontrib><creatorcontrib>RAMANATHAN, Venkatesh</creatorcontrib><creatorcontrib>VERMA, SagarKumar</creatorcontrib><creatorcontrib>AGRAWAL, Supriya</creatorcontrib><title>METHOD AND SYSTEM FOR TEST CASE GENERATION FOR EVENT BASED SYSTEMS USING GRAPH PATH TRAVERSAL</title><description>Product testing ensures whether the product is defect free or not and it is an important part of any product before product release. Any inadequacy in testing can result in financial losses and also damage the reputation, brand, and business. Functional testing is important since it verifies that the products functioning meets its requirements. Conventional methods mainly focus on executing test cases rather than generating test cases. Hence there is challenge to create scalable test cases for products with huge volume of data and with complex features. The present disclosure generates a plurality of time bound test cases based on an Artificial Rain Drop (ARD) algorithm. Here, events associated with an event based system are compiled in a tabular format. Each of the plurality of events are represented as a regular expression. Further, timed finite automaton is constructed for each regular expression prior to applying the ARD algorithm.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjEKwkAQRuE0FqLe4b-AhaaIlmMy2Q2Y3bAzCVhICLJWooF4fxTR3uoV35sn55rV-gLkCshJlGuUPkBZFDkJw7DjQFp59wHu2CkOb_n9glYqZ2ACNRYNqYUG6jgIHZfJ7Drcprj6dpGgZM3tOo6PPk7jcIn3-Oy5SbP9NttltEn_WF54XTJD</recordid><startdate>20210317</startdate><enddate>20210317</enddate><creator>ZARE, Amey</creator><creator>SHROTRI, Ulka</creator><creator>RAMANATHAN, Venkatesh</creator><creator>VERMA, SagarKumar</creator><creator>AGRAWAL, Supriya</creator><scope>EVB</scope></search><sort><creationdate>20210317</creationdate><title>METHOD AND SYSTEM FOR TEST CASE GENERATION FOR EVENT BASED SYSTEMS USING GRAPH PATH TRAVERSAL</title><author>ZARE, Amey ; SHROTRI, Ulka ; RAMANATHAN, Venkatesh ; VERMA, SagarKumar ; AGRAWAL, Supriya</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3792787A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>ZARE, Amey</creatorcontrib><creatorcontrib>SHROTRI, Ulka</creatorcontrib><creatorcontrib>RAMANATHAN, Venkatesh</creatorcontrib><creatorcontrib>VERMA, SagarKumar</creatorcontrib><creatorcontrib>AGRAWAL, Supriya</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZARE, Amey</au><au>SHROTRI, Ulka</au><au>RAMANATHAN, Venkatesh</au><au>VERMA, SagarKumar</au><au>AGRAWAL, Supriya</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>METHOD AND SYSTEM FOR TEST CASE GENERATION FOR EVENT BASED SYSTEMS USING GRAPH PATH TRAVERSAL</title><date>2021-03-17</date><risdate>2021</risdate><abstract>Product testing ensures whether the product is defect free or not and it is an important part of any product before product release. Any inadequacy in testing can result in financial losses and also damage the reputation, brand, and business. Functional testing is important since it verifies that the products functioning meets its requirements. Conventional methods mainly focus on executing test cases rather than generating test cases. Hence there is challenge to create scalable test cases for products with huge volume of data and with complex features. The present disclosure generates a plurality of time bound test cases based on an Artificial Rain Drop (ARD) algorithm. Here, events associated with an event based system are compiled in a tabular format. Each of the plurality of events are represented as a regular expression. Further, timed finite automaton is constructed for each regular expression prior to applying the ARD algorithm.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP3792787A1
source esp@cenet
subjects CALCULATING
COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title METHOD AND SYSTEM FOR TEST CASE GENERATION FOR EVENT BASED SYSTEMS USING GRAPH PATH TRAVERSAL
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-14T10%3A24%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZARE,%20Amey&rft.date=2021-03-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3792787A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true