FOREIGN MATERIAL INSPECTION SYSTEM OF DISPLAY UNIT

FOREIGN MATERIAL INSPECTION SYSTEM OF DISPLAY UNIT

An exemplary embodiment of the present invention provides a foreign substance inspection system for a display unit, including: a lighting unit configured to provide incident light to a display unit having an organic light emitting display panel; and a foreign substance detecting unit configured to r...

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Hauptverfasser: JANG, Eung Jin, LIM, Yu Jin, KIM, Chan Soo, LEE, Beom Seok, BAEK, Sung Hyun
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator JANG, Eung Jin
LIM, Yu Jin
KIM, Chan Soo
LEE, Beom Seok
BAEK, Sung Hyun
description An exemplary embodiment of the present invention provides a foreign substance inspection system for a display unit, including: a lighting unit configured to provide incident light to a display unit having an organic light emitting display panel; and a foreign substance detecting unit configured to receive incident light that is reflected by the display unit and detect whether a foreign substance is introduced into the display unit
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subjects ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title FOREIGN MATERIAL INSPECTION SYSTEM OF DISPLAY UNIT
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