ANTENNAS-IN-PACKAGE VERIFICATION BOARD
Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are di...
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| creator | TSAI, Wen-Tsai SUN, Te-Liang HUNG, Tzu-Chieh FANG, Chien-Tse HUANG, Po-Chia TAI, Yang CHANG, Su-Wei LIN, Chueh-Jen LU, Ying-Yen |
| description | Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided. |
| format | Patent |
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The DUT has a beamforming function. The antenna array is arranged opposite to the DUT, and emits beams with beamforming. Two reflecting plates are disposed opposite to each other, and are arranged between the DUT and the antenna array. The beam OTA test of the DUT is carried out by propagation of the beams between the antenna array, the DUT and the two reflecting plates. Accordingly, the test time can be greatly shortened and the cost of test can be effectively reduced. In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.</description><language>eng ; fre ; ger</language><subject>ANTENNAS, i.e. RADIO AERIALS ; BASIC ELECTRIC ELEMENTS ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230719&DB=EPODOC&CC=EP&NR=3780275B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76419</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230719&DB=EPODOC&CC=EP&NR=3780275B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TSAI, Wen-Tsai</creatorcontrib><creatorcontrib>SUN, Te-Liang</creatorcontrib><creatorcontrib>HUNG, Tzu-Chieh</creatorcontrib><creatorcontrib>FANG, Chien-Tse</creatorcontrib><creatorcontrib>HUANG, Po-Chia</creatorcontrib><creatorcontrib>TAI, Yang</creatorcontrib><creatorcontrib>CHANG, Su-Wei</creatorcontrib><creatorcontrib>LIN, Chueh-Jen</creatorcontrib><creatorcontrib>LU, Ying-Yen</creatorcontrib><title>ANTENNAS-IN-PACKAGE VERIFICATION BOARD</title><description>Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. 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In addition to the above-mentioned rapid OTA production line test platform, platforms for performing the OTA production line test by using horn antenna arrays together with bending waveguides and using a 3D elliptic curve are also provided.</description><subject>ANTENNAS, i.e. RADIO AERIALS</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBz9Atx9fNzDNb19NMNcHT2dnR3VQhzDfJ083R2DPH091Nw8ncMcuFhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuAcbmFgZG5qZOhsZEKAEAdbojFw</recordid><startdate>20230719</startdate><enddate>20230719</enddate><creator>TSAI, Wen-Tsai</creator><creator>SUN, Te-Liang</creator><creator>HUNG, Tzu-Chieh</creator><creator>FANG, Chien-Tse</creator><creator>HUANG, Po-Chia</creator><creator>TAI, Yang</creator><creator>CHANG, Su-Wei</creator><creator>LIN, Chueh-Jen</creator><creator>LU, Ying-Yen</creator><scope>EVB</scope></search><sort><creationdate>20230719</creationdate><title>ANTENNAS-IN-PACKAGE VERIFICATION BOARD</title><author>TSAI, Wen-Tsai ; SUN, Te-Liang ; HUNG, Tzu-Chieh ; FANG, Chien-Tse ; HUANG, Po-Chia ; TAI, Yang ; CHANG, Su-Wei ; LIN, Chueh-Jen ; LU, Ying-Yen</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3780275B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2023</creationdate><topic>ANTENNAS, i.e. RADIO AERIALS</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TSAI, Wen-Tsai</creatorcontrib><creatorcontrib>SUN, Te-Liang</creatorcontrib><creatorcontrib>HUNG, Tzu-Chieh</creatorcontrib><creatorcontrib>FANG, Chien-Tse</creatorcontrib><creatorcontrib>HUANG, Po-Chia</creatorcontrib><creatorcontrib>TAI, Yang</creatorcontrib><creatorcontrib>CHANG, Su-Wei</creatorcontrib><creatorcontrib>LIN, Chueh-Jen</creatorcontrib><creatorcontrib>LU, Ying-Yen</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TSAI, Wen-Tsai</au><au>SUN, Te-Liang</au><au>HUNG, Tzu-Chieh</au><au>FANG, Chien-Tse</au><au>HUANG, Po-Chia</au><au>TAI, Yang</au><au>CHANG, Su-Wei</au><au>LIN, Chueh-Jen</au><au>LU, Ying-Yen</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ANTENNAS-IN-PACKAGE VERIFICATION BOARD</title><date>2023-07-19</date><risdate>2023</risdate><abstract>Provided is a rapid over-the-air (OTA) production line test platform, including a device under test (DUT), an antenna array and two reflecting plates. 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| language | eng ; fre ; ger |
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| subjects | ANTENNAS, i.e. RADIO AERIALS BASIC ELECTRIC ELEMENTS ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | ANTENNAS-IN-PACKAGE VERIFICATION BOARD |
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