TEMPERATURE COMPENSATED STRAIN GAUGE MEASUREMENTS
A device (50) for measuring the strain (1a) of an object (1) independently of temperature variations, comprising:* at least one strain gauge (2) that is attachable directly or indirectly to the object (1) whose strain (1a) is to be measured;* a first temperature sensor (51) configured to measure the...
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| creator | SZASZ, Paul DECKER, Andreas |
| description | A device (50) for measuring the strain (1a) of an object (1) independently of temperature variations, comprising:* at least one strain gauge (2) that is attachable directly or indirectly to the object (1) whose strain (1a) is to be measured;* a first temperature sensor (51) configured to measure the temperature (2c) of the at least one strain gauge (2);* read-out electronics (3) configured to measure the change of electrical resistance (2b) of the at least one strain gauge (2), wherein the read-out electronics (3) comprise at least one fixed resistor (31), wherein the read-out electronics (3) is configured such that the temperature (31c) of the at least one fixed resistor (31) is known and/or obtainable by measurement; and* an evaluation unit (53) to: correct the measured electrical resistance change (2b), and/or a strain (2a) of the strain gauge (2) and/or a strain (1a) of the object (1) determined from this resistance (2b), for contributions (4a, 4b) that arise from the temperature (2c) of the at least one strain gauge (2) and from the temperature (31c) of the fixed resistor (31), based on the temperature (2c) of the strain gauge (2), the temperature (31c) of the fixed resistor (31), and pre-stored calibration data (5). |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3771895A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3771895A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3771895A13</originalsourceid><addsrcrecordid>eNrjZDAMcfUNcA1yDAkNclVw9gey_YIdQ1xdFIJDghw9_RTcHUPdXRV8XR2DgQp8Xf1CgnkYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbxrgLG5uaGFpamjoTERSgA3Vyak</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>TEMPERATURE COMPENSATED STRAIN GAUGE MEASUREMENTS</title><source>esp@cenet</source><creator>SZASZ, Paul ; DECKER, Andreas</creator><creatorcontrib>SZASZ, Paul ; DECKER, Andreas</creatorcontrib><description>A device (50) for measuring the strain (1a) of an object (1) independently of temperature variations, comprising:* at least one strain gauge (2) that is attachable directly or indirectly to the object (1) whose strain (1a) is to be measured;* a first temperature sensor (51) configured to measure the temperature (2c) of the at least one strain gauge (2);* read-out electronics (3) configured to measure the change of electrical resistance (2b) of the at least one strain gauge (2), wherein the read-out electronics (3) comprise at least one fixed resistor (31), wherein the read-out electronics (3) is configured such that the temperature (31c) of the at least one fixed resistor (31) is known and/or obtainable by measurement; and* an evaluation unit (53) to: correct the measured electrical resistance change (2b), and/or a strain (2a) of the strain gauge (2) and/or a strain (1a) of the object (1) determined from this resistance (2b), for contributions (4a, 4b) that arise from the temperature (2c) of the at least one strain gauge (2) and from the temperature (31c) of the fixed resistor (31), based on the temperature (2c) of the strain gauge (2), the temperature (31c) of the fixed resistor (31), and pre-stored calibration data (5).</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210203&DB=EPODOC&CC=EP&NR=3771895A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210203&DB=EPODOC&CC=EP&NR=3771895A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SZASZ, Paul</creatorcontrib><creatorcontrib>DECKER, Andreas</creatorcontrib><title>TEMPERATURE COMPENSATED STRAIN GAUGE MEASUREMENTS</title><description>A device (50) for measuring the strain (1a) of an object (1) independently of temperature variations, comprising:* at least one strain gauge (2) that is attachable directly or indirectly to the object (1) whose strain (1a) is to be measured;* a first temperature sensor (51) configured to measure the temperature (2c) of the at least one strain gauge (2);* read-out electronics (3) configured to measure the change of electrical resistance (2b) of the at least one strain gauge (2), wherein the read-out electronics (3) comprise at least one fixed resistor (31), wherein the read-out electronics (3) is configured such that the temperature (31c) of the at least one fixed resistor (31) is known and/or obtainable by measurement; and* an evaluation unit (53) to: correct the measured electrical resistance change (2b), and/or a strain (2a) of the strain gauge (2) and/or a strain (1a) of the object (1) determined from this resistance (2b), for contributions (4a, 4b) that arise from the temperature (2c) of the at least one strain gauge (2) and from the temperature (31c) of the fixed resistor (31), based on the temperature (2c) of the strain gauge (2), the temperature (31c) of the fixed resistor (31), and pre-stored calibration data (5).</description><subject>MEASURING</subject><subject>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAMcfUNcA1yDAkNclVw9gey_YIdQ1xdFIJDghw9_RTcHUPdXRV8XR2DgQp8Xf1CgnkYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbxrgLG5uaGFpamjoTERSgA3Vyak</recordid><startdate>20210203</startdate><enddate>20210203</enddate><creator>SZASZ, Paul</creator><creator>DECKER, Andreas</creator><scope>EVB</scope></search><sort><creationdate>20210203</creationdate><title>TEMPERATURE COMPENSATED STRAIN GAUGE MEASUREMENTS</title><author>SZASZ, Paul ; DECKER, Andreas</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3771895A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SZASZ, Paul</creatorcontrib><creatorcontrib>DECKER, Andreas</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SZASZ, Paul</au><au>DECKER, Andreas</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>TEMPERATURE COMPENSATED STRAIN GAUGE MEASUREMENTS</title><date>2021-02-03</date><risdate>2021</risdate><abstract>A device (50) for measuring the strain (1a) of an object (1) independently of temperature variations, comprising:* at least one strain gauge (2) that is attachable directly or indirectly to the object (1) whose strain (1a) is to be measured;* a first temperature sensor (51) configured to measure the temperature (2c) of the at least one strain gauge (2);* read-out electronics (3) configured to measure the change of electrical resistance (2b) of the at least one strain gauge (2), wherein the read-out electronics (3) comprise at least one fixed resistor (31), wherein the read-out electronics (3) is configured such that the temperature (31c) of the at least one fixed resistor (31) is known and/or obtainable by measurement; and* an evaluation unit (53) to: correct the measured electrical resistance change (2b), and/or a strain (2a) of the strain gauge (2) and/or a strain (1a) of the object (1) determined from this resistance (2b), for contributions (4a, 4b) that arise from the temperature (2c) of the at least one strain gauge (2) and from the temperature (31c) of the fixed resistor (31), based on the temperature (2c) of the strain gauge (2), the temperature (31c) of the fixed resistor (31), and pre-stored calibration data (5).</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | MEASURING MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE PHYSICS TESTING |
| title | TEMPERATURE COMPENSATED STRAIN GAUGE MEASUREMENTS |
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