POSITION MEASURING DEVICE

Die Erfindung betrifft eine Positionsmesseinrichtung zur Messung der Relativlage zweier Objekte in einer Vorschubrichtung und in weiteren Freiheitsgraden. Hierzu weist der Trägerkörper (1) zumindest drei in Vorschubrichtung verlaufende Oberflächen (O1, O2, O3) auf, von denen jede eine erste Messteil...

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Hauptverfasser: BECKER, Thomas, MITTERLEITNER, Josef, PUCHER, Wolfgang
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Sprache:eng ; fre ; ger
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creator BECKER, Thomas
MITTERLEITNER, Josef
PUCHER, Wolfgang
description Die Erfindung betrifft eine Positionsmesseinrichtung zur Messung der Relativlage zweier Objekte in einer Vorschubrichtung und in weiteren Freiheitsgraden. Hierzu weist der Trägerkörper (1) zumindest drei in Vorschubrichtung verlaufende Oberflächen (O1, O2, O3) auf, von denen jede eine erste Messteilung (T11-T13) und eine zweite Messteilung (T21-T23) trägt. Die erste Messteilung (T11-T13) und die zweite Messteilung (T21-T23) weisen jeweils eine Folge von Teilstrichen auf, wobei die Teilstriche der ersten Messteilung (T11-T13) gegenüber den Teilstrichen der zweiten Messteilung (T21-T23) geneigt sind. Zur Abtastung der Messteilungen (T11-T13, T21-T23) sind mehrere Abtasteinheiten (A11-A13, A21-A23) vorgesehen, die relativ zu den Messteilungen (T11-T13, T21-T26) derart angeordnet sind, dass sich ein gemeinsamer thermisch neutraler Punkt (P) ergibt. A position-measuring device includes a carrier body and scanning units movable relative thereto. At least three surfaces of the carrier body each carry a first and second measuring graduation, each having a series of graduation lines. Each of the measuring graduations is associated with a scanning unit for scanning the respective measuring graduation at a scanning location such that, for each surface, two scanning units are disposed for scanning the respective measuring graduations. In each case, these two scanning units are disposed in such a way, and the graduation lines of the two measuring graduations are inclined with respect to each other in such a way, that two normal planes extending respectively in the direction of the respective graduation lines through the respective scanning locations of the two scanning units have a common axis of intersection, whereby the three resulting axes of intersection extend through a common point.
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In each case, these two scanning units are disposed in such a way, and the graduation lines of the two measuring graduations are inclined with respect to each other in such a way, that two normal planes extending respectively in the direction of the respective graduation lines through the respective scanning locations of the two scanning units have a common axis of intersection, whereby the three resulting axes of intersection extend through a common point.</description><language>eng ; fre ; ger</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210113&amp;DB=EPODOC&amp;CC=EP&amp;NR=3764065A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20210113&amp;DB=EPODOC&amp;CC=EP&amp;NR=3764065A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BECKER, Thomas</creatorcontrib><creatorcontrib>MITTERLEITNER, Josef</creatorcontrib><creatorcontrib>PUCHER, Wolfgang</creatorcontrib><title>POSITION MEASURING DEVICE</title><description>Die Erfindung betrifft eine Positionsmesseinrichtung zur Messung der Relativlage zweier Objekte in einer Vorschubrichtung und in weiteren Freiheitsgraden. Hierzu weist der Trägerkörper (1) zumindest drei in Vorschubrichtung verlaufende Oberflächen (O1, O2, O3) auf, von denen jede eine erste Messteilung (T11-T13) und eine zweite Messteilung (T21-T23) trägt. Die erste Messteilung (T11-T13) und die zweite Messteilung (T21-T23) weisen jeweils eine Folge von Teilstrichen auf, wobei die Teilstriche der ersten Messteilung (T11-T13) gegenüber den Teilstrichen der zweiten Messteilung (T21-T23) geneigt sind. Zur Abtastung der Messteilungen (T11-T13, T21-T23) sind mehrere Abtasteinheiten (A11-A13, A21-A23) vorgesehen, die relativ zu den Messteilungen (T11-T13, T21-T26) derart angeordnet sind, dass sich ein gemeinsamer thermisch neutraler Punkt (P) ergibt. A position-measuring device includes a carrier body and scanning units movable relative thereto. At least three surfaces of the carrier body each carry a first and second measuring graduation, each having a series of graduation lines. 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In each case, these two scanning units are disposed in such a way, and the graduation lines of the two measuring graduations are inclined with respect to each other in such a way, that two normal planes extending respectively in the direction of the respective graduation lines through the respective scanning locations of the two scanning units have a common axis of intersection, whereby the three resulting axes of intersection extend through a common point.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJAM8A_2DPH091PwdXUMDg3y9HNXcHEN83R25WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BxuZmJgZmpo6GxkQoAQDi6B-2</recordid><startdate>20210113</startdate><enddate>20210113</enddate><creator>BECKER, Thomas</creator><creator>MITTERLEITNER, Josef</creator><creator>PUCHER, Wolfgang</creator><scope>EVB</scope></search><sort><creationdate>20210113</creationdate><title>POSITION MEASURING DEVICE</title><author>BECKER, Thomas ; MITTERLEITNER, Josef ; PUCHER, Wolfgang</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3764065A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2021</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BECKER, Thomas</creatorcontrib><creatorcontrib>MITTERLEITNER, Josef</creatorcontrib><creatorcontrib>PUCHER, Wolfgang</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BECKER, Thomas</au><au>MITTERLEITNER, Josef</au><au>PUCHER, Wolfgang</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>POSITION MEASURING DEVICE</title><date>2021-01-13</date><risdate>2021</risdate><abstract>Die Erfindung betrifft eine Positionsmesseinrichtung zur Messung der Relativlage zweier Objekte in einer Vorschubrichtung und in weiteren Freiheitsgraden. Hierzu weist der Trägerkörper (1) zumindest drei in Vorschubrichtung verlaufende Oberflächen (O1, O2, O3) auf, von denen jede eine erste Messteilung (T11-T13) und eine zweite Messteilung (T21-T23) trägt. Die erste Messteilung (T11-T13) und die zweite Messteilung (T21-T23) weisen jeweils eine Folge von Teilstrichen auf, wobei die Teilstriche der ersten Messteilung (T11-T13) gegenüber den Teilstrichen der zweiten Messteilung (T21-T23) geneigt sind. Zur Abtastung der Messteilungen (T11-T13, T21-T23) sind mehrere Abtasteinheiten (A11-A13, A21-A23) vorgesehen, die relativ zu den Messteilungen (T11-T13, T21-T26) derart angeordnet sind, dass sich ein gemeinsamer thermisch neutraler Punkt (P) ergibt. A position-measuring device includes a carrier body and scanning units movable relative thereto. At least three surfaces of the carrier body each carry a first and second measuring graduation, each having a series of graduation lines. Each of the measuring graduations is associated with a scanning unit for scanning the respective measuring graduation at a scanning location such that, for each surface, two scanning units are disposed for scanning the respective measuring graduations. In each case, these two scanning units are disposed in such a way, and the graduation lines of the two measuring graduations are inclined with respect to each other in such a way, that two normal planes extending respectively in the direction of the respective graduation lines through the respective scanning locations of the two scanning units have a common axis of intersection, whereby the three resulting axes of intersection extend through a common point.</abstract><oa>free_for_read</oa></addata></record>
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
title POSITION MEASURING DEVICE
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