A METHOD AND SYSTEM FOR DETERMINING THE LOCATION OF ARTEFACTS AND/OR INCLUSIONS IN A GEMSTONE, MINERAL, OR SAMPLE THEREOF

A method and system for determining a location of artefacts and/or inclusions in a gemstone, mineral or sample thereof, the method comprising the steps of: surface mapping a gemstone, mineral or sample thereof to determine surface geometry associated with at least a portion of a surface of the gemst...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CHOW, Jong Hann, SENDEN, Timothy John, HUANG, Keshu, SHEPPARD, Adrian Paul, LATHAM, Shane Jamie, FLEDDERMANN, Roland
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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