CORRECTION CIRCUIT AND RELATED SIGNAL PROCESSING CIRCUIT, AND CHIP

The application discloses a calibration circuit (140), and the calibration circuit includes: a delay module (180), configured to generate a pre-determined delayed reference signal; a first window function module (101), configured to convert a reference signal into a converted reference signal; a sec...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	NG, Si Herng
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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