CORRECTION CIRCUIT AND RELATED SIGNAL PROCESSING CIRCUIT, AND CHIP
The application discloses a calibration circuit (140), and the calibration circuit includes: a delay module (180), configured to generate a pre-determined delayed reference signal; a first window function module (101), configured to convert a reference signal into a converted reference signal; a sec...
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| creator | NG, Si Herng |
| description | The application discloses a calibration circuit (140), and the calibration circuit includes: a delay module (180), configured to generate a pre-determined delayed reference signal; a first window function module (101), configured to convert a reference signal into a converted reference signal; a second window function module (102), configured to convert a delayed reference signal into a converted delayed reference signal; a third window function module (103), configured to convert the pre-determined delayed reference signal into a converted pre-determined delayed reference signal; a first delay time computation module, generating a first delay time to be calibrated by receiving the converted reference signal and the converted delayed reference signal; a second delay time computation module, generating a second delay time to be calibrated by receiving the converted reference signal and the converted pre-determined delayed reference signal; and a computation module (190), configured to compute a gain coefficient based on the first delay time to be calibrated and the second delay time to be calibrated. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3751238A4</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3751238A4</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3751238A43</originalsourceid><addsrcrecordid>eNrjZHBy9g8KcnUO8fT3U3D2DHIO9QxRcPRzUQhy9XEMcXVRCPZ093P0UQgI8nd2DQ729HOHqdIBK3P28AzgYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgHG5qaGRsYWjibGRCgBAJ07KqE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CORRECTION CIRCUIT AND RELATED SIGNAL PROCESSING CIRCUIT, AND CHIP</title><source>esp@cenet</source><creator>NG, Si Herng</creator><creatorcontrib>NG, Si Herng</creatorcontrib><description>The application discloses a calibration circuit (140), and the calibration circuit includes: a delay module (180), configured to generate a pre-determined delayed reference signal; a first window function module (101), configured to convert a reference signal into a converted reference signal; a second window function module (102), configured to convert a delayed reference signal into a converted delayed reference signal; a third window function module (103), configured to convert the pre-determined delayed reference signal into a converted pre-determined delayed reference signal; a first delay time computation module, generating a first delay time to be calibrated by receiving the converted reference signal and the converted delayed reference signal; a second delay time computation module, generating a second delay time to be calibrated by receiving the converted reference signal and the converted pre-determined delayed reference signal; and a computation module (190), configured to compute a gain coefficient based on the first delay time to be calibrated and the second delay time to be calibrated.</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL ; METERING BY VOLUME ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210915&DB=EPODOC&CC=EP&NR=3751238A4$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210915&DB=EPODOC&CC=EP&NR=3751238A4$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NG, Si Herng</creatorcontrib><title>CORRECTION CIRCUIT AND RELATED SIGNAL PROCESSING CIRCUIT, AND CHIP</title><description>The application discloses a calibration circuit (140), and the calibration circuit includes: a delay module (180), configured to generate a pre-determined delayed reference signal; a first window function module (101), configured to convert a reference signal into a converted reference signal; a second window function module (102), configured to convert a delayed reference signal into a converted delayed reference signal; a third window function module (103), configured to convert the pre-determined delayed reference signal into a converted pre-determined delayed reference signal; a first delay time computation module, generating a first delay time to be calibrated by receiving the converted reference signal and the converted delayed reference signal; a second delay time computation module, generating a second delay time to be calibrated by receiving the converted reference signal and the converted pre-determined delayed reference signal; and a computation module (190), configured to compute a gain coefficient based on the first delay time to be calibrated and the second delay time to be calibrated.</description><subject>MEASURING</subject><subject>MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL</subject><subject>METERING BY VOLUME</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHBy9g8KcnUO8fT3U3D2DHIO9QxRcPRzUQhy9XEMcXVRCPZ093P0UQgI8nd2DQ729HOHqdIBK3P28AzgYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgHG5qaGRsYWjibGRCgBAJ07KqE</recordid><startdate>20210915</startdate><enddate>20210915</enddate><creator>NG, Si Herng</creator><scope>EVB</scope></search><sort><creationdate>20210915</creationdate><title>CORRECTION CIRCUIT AND RELATED SIGNAL PROCESSING CIRCUIT, AND CHIP</title><author>NG, Si Herng</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3751238A43</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2021</creationdate><topic>MEASURING</topic><topic>MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL</topic><topic>METERING BY VOLUME</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NG, Si Herng</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NG, Si Herng</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CORRECTION CIRCUIT AND RELATED SIGNAL PROCESSING CIRCUIT, AND CHIP</title><date>2021-09-15</date><risdate>2021</risdate><abstract>The application discloses a calibration circuit (140), and the calibration circuit includes: a delay module (180), configured to generate a pre-determined delayed reference signal; a first window function module (101), configured to convert a reference signal into a converted reference signal; a second window function module (102), configured to convert a delayed reference signal into a converted delayed reference signal; a third window function module (103), configured to convert the pre-determined delayed reference signal into a converted pre-determined delayed reference signal; a first delay time computation module, generating a first delay time to be calibrated by receiving the converted reference signal and the converted delayed reference signal; a second delay time computation module, generating a second delay time to be calibrated by receiving the converted reference signal and the converted pre-determined delayed reference signal; and a computation module (190), configured to compute a gain coefficient based on the first delay time to be calibrated and the second delay time to be calibrated.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | MEASURING MEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUIDLEVEL METERING BY VOLUME PHYSICS TESTING |
| title | CORRECTION CIRCUIT AND RELATED SIGNAL PROCESSING CIRCUIT, AND CHIP |
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