METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY METHOD

METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY METHOD

The present invention provides a method for analyzing a sample containing metal fine particles with an inductive coupling plasma mass spectrometer. The method enables analysis of the sample without the need of standard metal fine particles. Specifically, the present invention relates to a method for...

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Hauptverfasser: KAWABATA, Katsuhiko, NISHIGUCHI, Kohei, ICHINOSE, Tatsuya
Format: Patent
Sprache:eng ; fre ; ger
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BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator KAWABATA, Katsuhiko
NISHIGUCHI, Kohei
ICHINOSE, Tatsuya
description The present invention provides a method for analyzing a sample containing metal fine particles with an inductive coupling plasma mass spectrometer. The method enables analysis of the sample without the need of standard metal fine particles. Specifically, the present invention relates to a method for analyzing metal fine particles in liquid by use of an inductive coupling plasma mass spectrometer. In the method, the analysis apparatus is provided with a standard solution introduction apparatus including a standard solution storage unit for storing a standard solution containing a specific element in a known concentration, a syringe pump for suctioning and discharging the standard solution, and a solution introduction unit having a standard solution nebulizer and a standard solution spray chamber that are supplied with the standard solution, the standard solution is directly supplied to the standard solution nebulizer at a flow rate of 3 µL/min or less, and a particle diameter value of metal fine particles of a specific element is calculated based on a standard solution signal intensity obtained from a detector and a physical amount of an introduced specific element.
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In the method, the analysis apparatus is provided with a standard solution introduction apparatus including a standard solution storage unit for storing a standard solution containing a specific element in a known concentration, a syringe pump for suctioning and discharging the standard solution, and a solution introduction unit having a standard solution nebulizer and a standard solution spray chamber that are supplied with the standard solution, the standard solution is directly supplied to the standard solution nebulizer at a flow rate of 3 µL/min or less, and a particle diameter value of metal fine particles of a specific element is calculated based on a standard solution signal intensity obtained from a detector and a physical amount of an introduced specific element.</abstract><oa>free_for_read</oa></addata></record>
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY METHOD
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