METHOD FOR INSPECTING INSERTION STATE OF PLURALITY OF PINS INSERTED INTO SUBSTRATE, AND SUBSTRATE INSPECTION DEVICE

A substrate inspection apparatus may include a communication circuit, a plurality of light sources, an image sensor, at least one memory, and at least one processor. The processor may be configured to generate pin insertion state information indicating an insertion state of each of a plurality of fi...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LIM, Woo Young, KOO, Dae Sung, KIM, Yong
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS MEASURING PHYSICS PRINTED CIRCUITS TESTING
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