APPARATUSES, SYSTEMS, AND METHODS FOR IMPROVED VIBRATION RESISTANCE

Apparatuses, systems, and associated methods of assembly are described that provide for improved probed assemblies for use in sensors configured to convert between motion and electrical signals. An example probe assembly includes a probe rod defining a first end. In an operational configuration, the...

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Bibliographische Detailangaben
Hauptverfasser:	SAJJAN, Murgesh R, DANIELS, Aaron, LICATA, Charles
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	Apparatuses, systems, and associated methods of assembly are described that provide for improved probed assemblies for use in sensors configured to convert between motion and electrical signals. An example probe assembly includes a probe rod defining a first end. In an operational configuration, the probe rod is at least partially received by a sensor device. The probe assembly further includes a probe head that receives the first end of the probe rod. The probe head mates with the first end so as to secure the probe rod therein. The first end of the probe rod is further welded to the probe head via a butt welding technique.