KIT-LESS PICK AND PLACE HANDLER
The present disclosure provides for a kit-less pick and place handler which conducts thermal testing of at least one device. An exemplary handler includes a thermal soak plate, a first prime mover, a second prime mover, a test site actuator, and a test contactor. The thermal soak plate can receive d...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | STUCKEY, Larry BLUMENSHINE, Kent SHEKHTMAN, Igor SCHOLEFIELD, Colin LEWIS, John |
description | The present disclosure provides for a kit-less pick and place handler which conducts thermal testing of at least one device. An exemplary handler includes a thermal soak plate, a first prime mover, a second prime mover, a test site actuator, and a test contactor. The thermal soak plate can receive devices and maintain an accurate position of the devices using a friction between the thermal soak plate and the device. The test contactor can electrically contact the device. The first prime mover can place the device on the thermal soak plate. The second prime mover can carry the device to the test contactor, hold the device during thermal testing, and move the device from the test contactor. The test site actuator can exert force on the second prime mover during thermal testing. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3729115A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3729115A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3729115A13</originalsourceid><addsrcrecordid>eNrjZJD39gzR9XENDlYI8HT2VnD0c1EI8HF0dlXwADJ9XIN4GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakm8a4CxuZGloaGpo6ExEUoAaaIgzw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>KIT-LESS PICK AND PLACE HANDLER</title><source>esp@cenet</source><creator>STUCKEY, Larry ; BLUMENSHINE, Kent ; SHEKHTMAN, Igor ; SCHOLEFIELD, Colin ; LEWIS, John</creator><creatorcontrib>STUCKEY, Larry ; BLUMENSHINE, Kent ; SHEKHTMAN, Igor ; SCHOLEFIELD, Colin ; LEWIS, John</creatorcontrib><description>The present disclosure provides for a kit-less pick and place handler which conducts thermal testing of at least one device. An exemplary handler includes a thermal soak plate, a first prime mover, a second prime mover, a test site actuator, and a test contactor. The thermal soak plate can receive devices and maintain an accurate position of the devices using a friction between the thermal soak plate and the device. The test contactor can electrically contact the device. The first prime mover can place the device on the thermal soak plate. The second prime mover can carry the device to the test contactor, hold the device during thermal testing, and move the device from the test contactor. The test site actuator can exert force on the second prime mover during thermal testing.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201028&DB=EPODOC&CC=EP&NR=3729115A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201028&DB=EPODOC&CC=EP&NR=3729115A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>STUCKEY, Larry</creatorcontrib><creatorcontrib>BLUMENSHINE, Kent</creatorcontrib><creatorcontrib>SHEKHTMAN, Igor</creatorcontrib><creatorcontrib>SCHOLEFIELD, Colin</creatorcontrib><creatorcontrib>LEWIS, John</creatorcontrib><title>KIT-LESS PICK AND PLACE HANDLER</title><description>The present disclosure provides for a kit-less pick and place handler which conducts thermal testing of at least one device. An exemplary handler includes a thermal soak plate, a first prime mover, a second prime mover, a test site actuator, and a test contactor. The thermal soak plate can receive devices and maintain an accurate position of the devices using a friction between the thermal soak plate and the device. The test contactor can electrically contact the device. The first prime mover can place the device on the thermal soak plate. The second prime mover can carry the device to the test contactor, hold the device during thermal testing, and move the device from the test contactor. The test site actuator can exert force on the second prime mover during thermal testing.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJD39gzR9XENDlYI8HT2VnD0c1EI8HF0dlXwADJ9XIN4GFjTEnOKU3mhNDeDgptriLOHbmpBfnxqcUFicmpeakm8a4CxuZGloaGpo6ExEUoAaaIgzw</recordid><startdate>20201028</startdate><enddate>20201028</enddate><creator>STUCKEY, Larry</creator><creator>BLUMENSHINE, Kent</creator><creator>SHEKHTMAN, Igor</creator><creator>SCHOLEFIELD, Colin</creator><creator>LEWIS, John</creator><scope>EVB</scope></search><sort><creationdate>20201028</creationdate><title>KIT-LESS PICK AND PLACE HANDLER</title><author>STUCKEY, Larry ; BLUMENSHINE, Kent ; SHEKHTMAN, Igor ; SCHOLEFIELD, Colin ; LEWIS, John</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3729115A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2020</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>STUCKEY, Larry</creatorcontrib><creatorcontrib>BLUMENSHINE, Kent</creatorcontrib><creatorcontrib>SHEKHTMAN, Igor</creatorcontrib><creatorcontrib>SCHOLEFIELD, Colin</creatorcontrib><creatorcontrib>LEWIS, John</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>STUCKEY, Larry</au><au>BLUMENSHINE, Kent</au><au>SHEKHTMAN, Igor</au><au>SCHOLEFIELD, Colin</au><au>LEWIS, John</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>KIT-LESS PICK AND PLACE HANDLER</title><date>2020-10-28</date><risdate>2020</risdate><abstract>The present disclosure provides for a kit-less pick and place handler which conducts thermal testing of at least one device. An exemplary handler includes a thermal soak plate, a first prime mover, a second prime mover, a test site actuator, and a test contactor. The thermal soak plate can receive devices and maintain an accurate position of the devices using a friction between the thermal soak plate and the device. The test contactor can electrically contact the device. The first prime mover can place the device on the thermal soak plate. The second prime mover can carry the device to the test contactor, hold the device during thermal testing, and move the device from the test contactor. The test site actuator can exert force on the second prime mover during thermal testing.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; fre ; ger |
recordid | cdi_epo_espacenet_EP3729115A1 |
source | esp@cenet |
subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
title | KIT-LESS PICK AND PLACE HANDLER |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-25T10%3A30%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=STUCKEY,%20Larry&rft.date=2020-10-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3729115A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |