LOW POWER MODE TESTING IN AN INTEGRATED CIRCUIT

An integrated circuit includes a plurality of external terminal circuits, each having an external terminal. The integrated circuit includes a wakeup detector including a plurality of inputs. Each input of the plurality of inputs is coupled to an external terminal circuit. The wakeup detector generat...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Jagannathan, Srikanth, Abhishek, Kumar, Luedeke, Thomas Henry, Ambati, Venkannababu, Cinque, Mark Shelton, Wright, Joseph Rollin
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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