ANALYSIS METHOD AND ANALYSIS DEVICE
To provide an analysis method and an analysis device that can easily prevent an abnormal measurement result from being detected. An analysis method for detecting an amount of a substance to be measured by irradiating an analysis chip containing the substance to be measured with detection light and d...
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| creator | SHOUJI Yuuya NODA Tetsuya MAJIMA Masanao |
| description | To provide an analysis method and an analysis device that can easily prevent an abnormal measurement result from being detected. An analysis method for detecting an amount of a substance to be measured by irradiating an analysis chip containing the substance to be measured with detection light and detecting a quantity of light output from the analysis chip, the analysis method including: a step of irradiating an incident surface of the analysis chip and another surface adjacent to the incident surface with the detection light while changing a relative position of the detection light with respect to the analysis chip, detecting reflected light from the incident surface of the analysis chip, and acquiring information on a position of the analysis chip from a relationship between a quantity of the reflected light detected and the relative position, wherein the analysis method further including: an abnormality determination step of determining that the analysis chip is abnormal in the case where a quantity of target reflected light is equal to or lower than a predetermined light quantity, the quantity of the target reflected light being a light quantity to be detected when the analysis chip is located at a position where a total beam diameter of the detection light is incident on the incident surface. |
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An analysis method for detecting an amount of a substance to be measured by irradiating an analysis chip containing the substance to be measured with detection light and detecting a quantity of light output from the analysis chip, the analysis method including: a step of irradiating an incident surface of the analysis chip and another surface adjacent to the incident surface with the detection light while changing a relative position of the detection light with respect to the analysis chip, detecting reflected light from the incident surface of the analysis chip, and acquiring information on a position of the analysis chip from a relationship between a quantity of the reflected light detected and the relative position, wherein the analysis method further including: an abnormality determination step of determining that the analysis chip is abnormal in the case where a quantity of target reflected light is equal to or lower than a predetermined light quantity, the quantity of the target reflected light being a light quantity to be detected when the analysis chip is located at a position where a total beam diameter of the detection light is incident on the incident surface.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB29HP0iQz2DFbwdQ3x8HdRcPQDYaiYi2uYp7MrDwNrWmJOcSovlOZmUHBzDXH20E0tyI9PLS5ITE7NSy2Jdw0wNjM3MbM0cTQ0JkIJAA9qIkw</recordid><startdate>20200701</startdate><enddate>20200701</enddate><creator>SHOUJI Yuuya</creator><creator>NODA Tetsuya</creator><creator>MAJIMA Masanao</creator><scope>EVB</scope></search><sort><creationdate>20200701</creationdate><title>ANALYSIS METHOD AND ANALYSIS DEVICE</title><author>SHOUJI Yuuya ; NODA Tetsuya ; MAJIMA Masanao</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3674694A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2020</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHOUJI Yuuya</creatorcontrib><creatorcontrib>NODA Tetsuya</creatorcontrib><creatorcontrib>MAJIMA Masanao</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHOUJI Yuuya</au><au>NODA Tetsuya</au><au>MAJIMA Masanao</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ANALYSIS METHOD AND ANALYSIS DEVICE</title><date>2020-07-01</date><risdate>2020</risdate><abstract>To provide an analysis method and an analysis device that can easily prevent an abnormal measurement result from being detected. 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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | ANALYSIS METHOD AND ANALYSIS DEVICE |
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