VOID FORMATION FOR CHARGE TRAP STRUCTURES

Various embodiments include methods and apparatus having a number of charge trap structures, where each charge trap structure includes a dielectric barrier between a gate and a blocking dielectric region, the blocking dielectric region located on a charge trap region of the charge trap structure. At...

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Bibliographische Detailangaben
1. Verfasser: CARLSON, Chris M
Format: Patent
Sprache:eng ; fre ; ger
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