ENHANCED GUIDED WAVE THERMOGRAPHY INSPECTION SYSTEMS AND METHODS OF USING THE SAME

ENHANCED GUIDED WAVE THERMOGRAPHY INSPECTION SYSTEMS AND METHODS OF USING THE SAME

Non-destructive inspection systems (10) and methods for inspecting structural flaws that may be in a structure (15) based on guided wave thermography. The method may include sweeping a frequency-phase space to maximize ultrasonic energy distribution across the structure while minimizing input energy...

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Hauptverfasser: OWENS, Steven E, BORIGO, Cody J, ZOMBO, Paul J, LANDY, James F, ROSE, Joseph L
Format: Patent
Sprache:eng ; fre ; ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator OWENS, Steven E
BORIGO, Cody J
ZOMBO, Paul J
LANDY, James F
ROSE, Joseph L
description Non-destructive inspection systems (10) and methods for inspecting structural flaws that may be in a structure (15) based on guided wave thermography. The method may include sweeping a frequency-phase space to maximize ultrasonic energy distribution across the structure while minimizing input energy, e.g., via a plurality of actuators. The system may include transducer elements (12, 14, 16, 17) configured to predominantly generate shear horizontal-type guided waves in the structure to maximize thermal response from any flaws.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title ENHANCED GUIDED WAVE THERMOGRAPHY INSPECTION SYSTEMS AND METHODS OF USING THE SAME
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