INSPECTION APPARATUS FOR OPTICALLY INSPECTING AN OBJECT, AND OBJECT INSPECTION ARRANGEMENT
The quality of objects and workpieces of a manufacturing process is often evaluated based on surface and/or form. An inspection apparatus for optically, in particular deflectometrically, inspecting an object includes a hollow body housing having an opening, the object being positionable in the openi...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | THOBE, Alexander BERGER, Martin |
| description | The quality of objects and workpieces of a manufacturing process is often evaluated based on surface and/or form. An inspection apparatus for optically, in particular deflectometrically, inspecting an object includes a hollow body housing having an opening, the object being positionable in the opening for the inspection; a camera having a plane of focus and a camera direction extending toward the opening of the housing, and being configured to take a plurality of object images of the object situated in the plane of focus; a plurality of light sources arranged around the opening and designed for variably illuminating the plane of focus; and an evaluation unit configured to determine a topography of the object based on the object images. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3615886A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3615886A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3615886A13</originalsourceid><addsrcrecordid>eNrjZIjy9AsOcHUO8fT3U3AMCHAMcgwJDVZw8w9S8A8I8XR29PGJVIAp8XNXcPRT8HfyAnJ0gEwXKFsB2YygIEc_d1dfV78QHgbWtMSc4lReKM3NoODmGuLsoZtakB-fWlyQmJyal1oS7xpgbGZoamFh5mhoTIQSAAx4MZg</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INSPECTION APPARATUS FOR OPTICALLY INSPECTING AN OBJECT, AND OBJECT INSPECTION ARRANGEMENT</title><source>esp@cenet</source><creator>THOBE, Alexander ; BERGER, Martin</creator><creatorcontrib>THOBE, Alexander ; BERGER, Martin</creatorcontrib><description>The quality of objects and workpieces of a manufacturing process is often evaluated based on surface and/or form. An inspection apparatus for optically, in particular deflectometrically, inspecting an object includes a hollow body housing having an opening, the object being positionable in the opening for the inspection; a camera having a plane of focus and a camera direction extending toward the opening of the housing, and being configured to take a plurality of object images of the object situated in the plane of focus; a plurality of light sources arranged around the opening and designed for variably illuminating the plane of focus; and an evaluation unit configured to determine a topography of the object based on the object images.</description><language>eng ; fre ; ger</language><subject>ELECTRIC COMMUNICATION TECHNIQUE ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; PICTORIAL COMMUNICATION, e.g. TELEVISION ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200304&DB=EPODOC&CC=EP&NR=3615886A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200304&DB=EPODOC&CC=EP&NR=3615886A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>THOBE, Alexander</creatorcontrib><creatorcontrib>BERGER, Martin</creatorcontrib><title>INSPECTION APPARATUS FOR OPTICALLY INSPECTING AN OBJECT, AND OBJECT INSPECTION ARRANGEMENT</title><description>The quality of objects and workpieces of a manufacturing process is often evaluated based on surface and/or form. An inspection apparatus for optically, in particular deflectometrically, inspecting an object includes a hollow body housing having an opening, the object being positionable in the opening for the inspection; a camera having a plane of focus and a camera direction extending toward the opening of the housing, and being configured to take a plurality of object images of the object situated in the plane of focus; a plurality of light sources arranged around the opening and designed for variably illuminating the plane of focus; and an evaluation unit configured to determine a topography of the object based on the object images.</description><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>PICTORIAL COMMUNICATION, e.g. TELEVISION</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZIjy9AsOcHUO8fT3U3AMCHAMcgwJDVZw8w9S8A8I8XR29PGJVIAp8XNXcPRT8HfyAnJ0gEwXKFsB2YygIEc_d1dfV78QHgbWtMSc4lReKM3NoODmGuLsoZtakB-fWlyQmJyal1oS7xpgbGZoamFh5mhoTIQSAAx4MZg</recordid><startdate>20200304</startdate><enddate>20200304</enddate><creator>THOBE, Alexander</creator><creator>BERGER, Martin</creator><scope>EVB</scope></search><sort><creationdate>20200304</creationdate><title>INSPECTION APPARATUS FOR OPTICALLY INSPECTING AN OBJECT, AND OBJECT INSPECTION ARRANGEMENT</title><author>THOBE, Alexander ; BERGER, Martin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3615886A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2020</creationdate><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>PICTORIAL COMMUNICATION, e.g. TELEVISION</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>THOBE, Alexander</creatorcontrib><creatorcontrib>BERGER, Martin</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>THOBE, Alexander</au><au>BERGER, Martin</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INSPECTION APPARATUS FOR OPTICALLY INSPECTING AN OBJECT, AND OBJECT INSPECTION ARRANGEMENT</title><date>2020-03-04</date><risdate>2020</risdate><abstract>The quality of objects and workpieces of a manufacturing process is often evaluated based on surface and/or form. An inspection apparatus for optically, in particular deflectometrically, inspecting an object includes a hollow body housing having an opening, the object being positionable in the opening for the inspection; a camera having a plane of focus and a camera direction extending toward the opening of the housing, and being configured to take a plurality of object images of the object situated in the plane of focus; a plurality of light sources arranged around the opening and designed for variably illuminating the plane of focus; and an evaluation unit configured to determine a topography of the object based on the object images.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP3615886A1 |
| source | esp@cenet |
| subjects | ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TESTING |
| title | INSPECTION APPARATUS FOR OPTICALLY INSPECTING AN OBJECT, AND OBJECT INSPECTION ARRANGEMENT |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T05%3A03%3A29IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=THOBE,%20Alexander&rft.date=2020-03-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3615886A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |