TEMPERATURE DETECTION CIRCUIT

To provide a temperature detection circuit that shortens test time and enables checking of the operation of diodes, transistors, and other components, for example.A temperature detection circuit includes a plurality of thermostats configured to change a level of signals to output, upon detecting an...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: NOZAWA, Ryo, SEKINO, Masahiro, TAKAHASHI, Jun, SAEKI, Yosuke, KURODA, Kazuto
Format: Patent
Sprache:eng ; fre ; ger
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Beschreibung
Zusammenfassung:To provide a temperature detection circuit that shortens test time and enables checking of the operation of diodes, transistors, and other components, for example.A temperature detection circuit includes a plurality of thermostats configured to change a level of signals to output, upon detecting an anomaly in temperature; a microprocessor configured to receive signals from the thermostats; a plurality of circuits that connect between the thermostats and the microprocessor; a connection point at which the circuits connect to each other; resistors in respective circuits that connect between the connection point and the thermostats; and voltage detection terminals respectively included in circuits that connect between the resistors and the thermostats, a circuit that connects between the connection point and at least one of the resistors, and a circuit that connects between the connection point and the microprocessor.