METHODS AND INSTRUMENTS FOR MEASURING SAMPLES IN A WELL PLATE

METHODS AND INSTRUMENTS FOR MEASURING SAMPLES IN A WELL PLATE

Methods and instruments for measuring a liquid sample (S1) in a well plate (50) by means of an optical chip 10. The chip (10) comprises an optical sensor (13) that is accessible to the liquid sample (S1) at a sampling area (SA) of the chip. A free-space optical coupler (11,12) is accessible to recei...

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Hauptverfasser: DE BOER, Bart Michiel, VAN DEN DOOL, Teunis Cornelis, HARMSMA, Peter Johan, ODERWALD, Michiel Peter
Format: Patent
Sprache:eng ; fre ; ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
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creator DE BOER, Bart Michiel
VAN DEN DOOL, Teunis Cornelis
HARMSMA, Peter Johan
ODERWALD, Michiel Peter
description Methods and instruments for measuring a liquid sample (S1) in a well plate (50) by means of an optical chip 10. The chip (10) comprises an optical sensor (13) that is accessible to the liquid sample (S1) at a sampling area (SA) of the chip. A free-space optical coupler (11,12) is accessible to receive input light (L1) and/or emit output light (L2) via a coupling area (CA) of the chip (10). The sampling area (SA) of the chip 10 is submerged in the liquid sample (S1) while keeping the liquid sample (S1) away from the coupling area (CA) for interrogating the optical coupler (11,12) via an optical path (P) that does not pass through the liquid sample (S1).
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
OPTICS
PHYSICS
TESTING
title METHODS AND INSTRUMENTS FOR MEASURING SAMPLES IN A WELL PLATE
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