ELECTRICAL TEST PROBE AND TESTING SYSTEM USING THE SAME

ELECTRICAL TEST PROBE AND TESTING SYSTEM USING THE SAME

An electrical test probe (200) is presented. It comprises a test prod (210), a tube (220) and an elastic element (230). The test prod (210) has a first terminal (211) provided to form a contact with a power module to be tested and a second terminal (212) provided to be connected with a testing equip...

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Hauptverfasser: HUANG, Jun, HE, Minghai, JIANG, Xuegang, TANG, Canglong
Format: Patent
Sprache:eng ; fre ; ger
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MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator HUANG, Jun
HE, Minghai
JIANG, Xuegang
TANG, Canglong
description An electrical test probe (200) is presented. It comprises a test prod (210), a tube (220) and an elastic element (230). The test prod (210) has a first terminal (211) provided to form a contact with a power module to be tested and a second terminal (212) provided to be connected with a testing equipment. The test prod (210) also has a first stopper (213) between the first terminal (211) and the second terminal (212). The tube (220) has an internally extending stopper (221). The tube (220) is mounted around the test prod (210) in a longitudinal direction of the test prod (210). The elastic element (230) is accommodated between the first stopper (213) of the test prod (210) and the internally extending stopper (221) of the tube (220). The tube (220) and the test prod (210) can have a relative movement within an elastic range of the elastic element (230). The area of a cross section of the test prod (210) is much larger than the area of the cross section of the elastic element (230). A power module testing system (600) which comprises at least one electrical test probe (200) is also presented.
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A power module testing system (600) which comprises at least one electrical test probe (200) is also presented.</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title ELECTRICAL TEST PROBE AND TESTING SYSTEM USING THE SAME
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