ARRANGEMENT AND METHOD FOR CALIBRATING TEMPERATURE SENSORS

A calibration arrangement (1) has a sealable and thermally-isolated chamber (10) comprising a socket mount (15) having a number of reference samples (18) in thermal contact with the socket mount (15) and a number of sample sockets (16) for devices-under test, DUTs (17), with each sample socket (16)...

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Bibliographische Detailangaben
Hauptverfasser:	De Jong, Frans, Nenadovic, Nebojsa, Ten Cate, Hans, Valter, Andreis, Calaerts, Geert, De Kok, Renie, Suy, Hilco, Sakic, Agata
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
Online-Zugang:	Volltext bestellen
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Beschreibung
Zusammenfassung:	A calibration arrangement (1) has a sealable and thermally-isolated chamber (10) comprising a socket mount (15) having a number of reference samples (18) in thermal contact with the socket mount (15) and a number of sample sockets (16) for devices-under test, DUTs (17), with each sample socket (16) being arranged in proximity to and associated to at least one of the reference samples (18). The arrangement (1) further comprises a thermal chuck (13) and a circuit board (14), which is configured to provide electrical connection to the reference samples (18) in the socket mount (15) and DUTs (17) in the sample sockets (16). The thermal chuck (13) is configured to thermalize the socket mount (15) and the circuit board (14) to a temperature set point.