DEVICE FOR MEASURING THE THICKNESS OF COATINGS

The present invention relates to a measuring device for determining the thickness of a dielectric layer on a conductive substrate. The device comprises a resonance cavity for electromagnetic fields which has a rotationally symmetrical wall, an end plate and an open end and is adapted to be positione...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	RICHTER, Maik, HINKEN, Johann, ZIEP, Christian
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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