SYSTEM AND METHOD FOR 3D SCENE RECONSTRUCTION WITH DUAL COMPLEMENTARY PATTERN ILLUMINATION
An apparatus, system and process for utilizing dual complementary pattern illumination of a scene when performing depth reconstruction of the scene are described. The method may include projecting a first reference image and a complementary second reference image on a scene, and capturing first imag...
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| creator | GANAPATI, Vidya REPHAELI, Eden |
| description | An apparatus, system and process for utilizing dual complementary pattern illumination of a scene when performing depth reconstruction of the scene are described. The method may include projecting a first reference image and a complementary second reference image on a scene, and capturing first image data and second image data including the first reference image and the complementary second reference image on the scene. The method may also include identifying features of the first reference image from features of the complementary second reference image. Furthermore, the method may include performing three-dimensional (3D) scene reconstruction for image data captured by the imaging device based on the identified features in the first reference image. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3465617B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3465617B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3465617B13</originalsourceid><addsrcrecordid>eNqNyjEKwjAUANAuDqLe4V_AoUTrHJNfEkh-QvKD1KUUiZNood4fETyA01veurnmITN6kKTBI5ugoQ8JhIaskBASqkCZU1FsA8HFsgFdpAMVfHTokVimAaJkxkRgnSvekvzmbbO6T4-l7n5uGuiRldnX-TXWZZ5u9VnfI0Zx6I5dezq34o_yAQ8WMcc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM AND METHOD FOR 3D SCENE RECONSTRUCTION WITH DUAL COMPLEMENTARY PATTERN ILLUMINATION</title><source>esp@cenet</source><creator>GANAPATI, Vidya ; REPHAELI, Eden</creator><creatorcontrib>GANAPATI, Vidya ; REPHAELI, Eden</creatorcontrib><description>An apparatus, system and process for utilizing dual complementary pattern illumination of a scene when performing depth reconstruction of the scene are described. The method may include projecting a first reference image and a complementary second reference image on a scene, and capturing first image data and second image data including the first reference image and the complementary second reference image on the scene. The method may also include identifying features of the first reference image from features of the complementary second reference image. Furthermore, the method may include performing three-dimensional (3D) scene reconstruction for image data captured by the imaging device based on the identified features in the first reference image.</description><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DIAGNOSIS ; HUMAN NECESSITIES ; HYGIENE ; IDENTIFICATION ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEDICAL OR VETERINARY SCIENCE ; PHYSICS ; SURGERY ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230913&DB=EPODOC&CC=EP&NR=3465617B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25569,76552</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230913&DB=EPODOC&CC=EP&NR=3465617B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GANAPATI, Vidya</creatorcontrib><creatorcontrib>REPHAELI, Eden</creatorcontrib><title>SYSTEM AND METHOD FOR 3D SCENE RECONSTRUCTION WITH DUAL COMPLEMENTARY PATTERN ILLUMINATION</title><description>An apparatus, system and process for utilizing dual complementary pattern illumination of a scene when performing depth reconstruction of the scene are described. The method may include projecting a first reference image and a complementary second reference image on a scene, and capturing first image data and second image data including the first reference image and the complementary second reference image on the scene. The method may also include identifying features of the first reference image from features of the complementary second reference image. Furthermore, the method may include performing three-dimensional (3D) scene reconstruction for image data captured by the imaging device based on the identified features in the first reference image.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DIAGNOSIS</subject><subject>HUMAN NECESSITIES</subject><subject>HYGIENE</subject><subject>IDENTIFICATION</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEDICAL OR VETERINARY SCIENCE</subject><subject>PHYSICS</subject><subject>SURGERY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyjEKwjAUANAuDqLe4V_AoUTrHJNfEkh-QvKD1KUUiZNood4fETyA01veurnmITN6kKTBI5ugoQ8JhIaskBASqkCZU1FsA8HFsgFdpAMVfHTokVimAaJkxkRgnSvekvzmbbO6T4-l7n5uGuiRldnX-TXWZZ5u9VnfI0Zx6I5dezq34o_yAQ8WMcc</recordid><startdate>20230913</startdate><enddate>20230913</enddate><creator>GANAPATI, Vidya</creator><creator>REPHAELI, Eden</creator><scope>EVB</scope></search><sort><creationdate>20230913</creationdate><title>SYSTEM AND METHOD FOR 3D SCENE RECONSTRUCTION WITH DUAL COMPLEMENTARY PATTERN ILLUMINATION</title><author>GANAPATI, Vidya ; REPHAELI, Eden</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3465617B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2023</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DIAGNOSIS</topic><topic>HUMAN NECESSITIES</topic><topic>HYGIENE</topic><topic>IDENTIFICATION</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEDICAL OR VETERINARY SCIENCE</topic><topic>PHYSICS</topic><topic>SURGERY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>GANAPATI, Vidya</creatorcontrib><creatorcontrib>REPHAELI, Eden</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GANAPATI, Vidya</au><au>REPHAELI, Eden</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM AND METHOD FOR 3D SCENE RECONSTRUCTION WITH DUAL COMPLEMENTARY PATTERN ILLUMINATION</title><date>2023-09-13</date><risdate>2023</risdate><abstract>An apparatus, system and process for utilizing dual complementary pattern illumination of a scene when performing depth reconstruction of the scene are described. The method may include projecting a first reference image and a complementary second reference image on a scene, and capturing first image data and second image data including the first reference image and the complementary second reference image on the scene. The method may also include identifying features of the first reference image from features of the complementary second reference image. Furthermore, the method may include performing three-dimensional (3D) scene reconstruction for image data captured by the imaging device based on the identified features in the first reference image.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING DIAGNOSIS HUMAN NECESSITIES HYGIENE IDENTIFICATION IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEDICAL OR VETERINARY SCIENCE PHYSICS SURGERY TESTING |
| title | SYSTEM AND METHOD FOR 3D SCENE RECONSTRUCTION WITH DUAL COMPLEMENTARY PATTERN ILLUMINATION |
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