Z-POSITION MOTION STAGE FOR USE IN A SCANNING PROBE MICROSCOPY SYSTEM, SCAN HEAD AND METHOD OF MANUFACTURING

The present document relates to a Z-position motion stage for use in a scanning probe microscopy system. The stage comprises a support element for mounting the z-position motion stage on a scan head, and at least one first actuator mounted on the support element for enabling motion of a probe of the...

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Hauptverfasser: van Riel, Martinus Cornelius Johannes Maria, Kastelijn, Aukje Arianne Annette, Dekker, Albert
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creator van Riel, Martinus Cornelius Johannes Maria
Kastelijn, Aukje Arianne Annette
Dekker, Albert
description The present document relates to a Z-position motion stage for use in a scanning probe microscopy system. The stage comprises a support element for mounting the z-position motion stage on a scan head, and at least one first actuator mounted on the support element for enabling motion of a probe of the scanning probe microscopy system. The probe is connected to or attachable to the z-position motion stage. The support element and the at least one first actuator are shaped and mounted such as to form a rotation symmetric element which is rotation symmetric around a notional common longitudinal axis. The document further relates to a scan head, a method of manufacturing a z-position motion stage, and a Z-position motion stage obtained with such a method.
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subjects APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM]
MEASURING
PHYSICS
SCANNING-PROBE TECHNIQUES OR APPARATUS
TESTING
title Z-POSITION MOTION STAGE FOR USE IN A SCANNING PROBE MICROSCOPY SYSTEM, SCAN HEAD AND METHOD OF MANUFACTURING
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