POSITION MEASURING DEVICE AND METHOD FOR OPERATING SAME

POSITION MEASURING DEVICE AND METHOD FOR OPERATING SAME

A position-measuring device includes a graduation carrier having a measuring graduation disposed thereon. At least one position sensor is configured to generate position-dependent measurement signals by scanning the measuring graduation. A processor is configured to process the position-dependent me...

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Hauptverfasser: LENZ, Sebastian, GEISLER, Thomas, JOACHIMSTHALER, Ingo, SOIER, Johannes
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
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creator LENZ, Sebastian
GEISLER, Thomas
JOACHIMSTHALER, Ingo
SOIER, Johannes
description A position-measuring device includes a graduation carrier having a measuring graduation disposed thereon. At least one position sensor is configured to generate position-dependent measurement signals by scanning the measuring graduation. A processor is configured to process the position-dependent measurement signals into position signals. An interface is configured to transmit the position signals to subsequent electronics via at least one data channel. At least one motion sensor is configured to generate time-varying measurement signals. A signal analyzer is configured to analyze the measurement signals in the frequency domain dependent on parameters that are transmittable from the subsequent electronics to the interface unit, and to produce result data that is transmittable from the interface unit to the subsequent electronics.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3460410B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3460410B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3460410B13</originalsourceid><addsrcrecordid>eNrjZDAP8A_2DPH091PwdXUMDg3y9HNXcHEN83R2VXD0cwEKhnj4uyi4-Qcp-Ae4BjmGgOSDHX1deRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJvGuAsYmZgYmhgZOhMRFKAOmMJ6Y</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>POSITION MEASURING DEVICE AND METHOD FOR OPERATING SAME</title><source>esp@cenet</source><creator>LENZ, Sebastian ; GEISLER, Thomas ; JOACHIMSTHALER, Ingo ; SOIER, Johannes</creator><creatorcontrib>LENZ, Sebastian ; GEISLER, Thomas ; JOACHIMSTHALER, Ingo ; SOIER, Johannes</creatorcontrib><description>A position-measuring device includes a graduation carrier having a measuring graduation disposed thereon. At least one position sensor is configured to generate position-dependent measurement signals by scanning the measuring graduation. A processor is configured to process the position-dependent measurement signals into position signals. An interface is configured to transmit the position signals to subsequent electronics via at least one data channel. At least one motion sensor is configured to generate time-varying measurement signals. A signal analyzer is configured to analyze the measurement signals in the frequency domain dependent on parameters that are transmittable from the subsequent electronics to the interface unit, and to produce result data that is transmittable from the interface unit to the subsequent electronics.</description><language>eng ; fre ; ger</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201028&amp;DB=EPODOC&amp;CC=EP&amp;NR=3460410B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20201028&amp;DB=EPODOC&amp;CC=EP&amp;NR=3460410B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LENZ, Sebastian</creatorcontrib><creatorcontrib>GEISLER, Thomas</creatorcontrib><creatorcontrib>JOACHIMSTHALER, Ingo</creatorcontrib><creatorcontrib>SOIER, Johannes</creatorcontrib><title>POSITION MEASURING DEVICE AND METHOD FOR OPERATING SAME</title><description>A position-measuring device includes a graduation carrier having a measuring graduation disposed thereon. At least one position sensor is configured to generate position-dependent measurement signals by scanning the measuring graduation. A processor is configured to process the position-dependent measurement signals into position signals. An interface is configured to transmit the position signals to subsequent electronics via at least one data channel. At least one motion sensor is configured to generate time-varying measurement signals. A signal analyzer is configured to analyze the measurement signals in the frequency domain dependent on parameters that are transmittable from the subsequent electronics to the interface unit, and to produce result data that is transmittable from the interface unit to the subsequent electronics.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAP8A_2DPH091PwdXUMDg3y9HNXcHEN83R2VXD0cwEKhnj4uyi4-Qcp-Ae4BjmGgOSDHX1deRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJvGuAsYmZgYmhgZOhMRFKAOmMJ6Y</recordid><startdate>20201028</startdate><enddate>20201028</enddate><creator>LENZ, Sebastian</creator><creator>GEISLER, Thomas</creator><creator>JOACHIMSTHALER, Ingo</creator><creator>SOIER, Johannes</creator><scope>EVB</scope></search><sort><creationdate>20201028</creationdate><title>POSITION MEASURING DEVICE AND METHOD FOR OPERATING SAME</title><author>LENZ, Sebastian ; GEISLER, Thomas ; JOACHIMSTHALER, Ingo ; SOIER, Johannes</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3460410B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2020</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>LENZ, Sebastian</creatorcontrib><creatorcontrib>GEISLER, Thomas</creatorcontrib><creatorcontrib>JOACHIMSTHALER, Ingo</creatorcontrib><creatorcontrib>SOIER, Johannes</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LENZ, Sebastian</au><au>GEISLER, Thomas</au><au>JOACHIMSTHALER, Ingo</au><au>SOIER, Johannes</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>POSITION MEASURING DEVICE AND METHOD FOR OPERATING SAME</title><date>2020-10-28</date><risdate>2020</risdate><abstract>A position-measuring device includes a graduation carrier having a measuring graduation disposed thereon. At least one position sensor is configured to generate position-dependent measurement signals by scanning the measuring graduation. A processor is configured to process the position-dependent measurement signals into position signals. An interface is configured to transmit the position signals to subsequent electronics via at least one data channel. At least one motion sensor is configured to generate time-varying measurement signals. A signal analyzer is configured to analyze the measurement signals in the frequency domain dependent on parameters that are transmittable from the subsequent electronics to the interface unit, and to produce result data that is transmittable from the interface unit to the subsequent electronics.</abstract><oa>free_for_read</oa></addata></record>
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subjects ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS
MEASURING
MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE
MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
PHYSICS
TARIFF METERING APPARATUS
TESTING
title POSITION MEASURING DEVICE AND METHOD FOR OPERATING SAME
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-21T11%3A57%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=LENZ,%20Sebastian&rft.date=2020-10-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3460410B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true