SYSTEMS AND METHODS FOR IMPROVED COLLIMATION SENSITIVITY
A detector assembly 100 is provided that includes a semiconductor detector 110, a pinhole collimator 130, and a processing unit 150. The semiconductor detector 110 has a first surface 112 and a second surface 114 opposed to each other. The first surface includes pixels, and the second surface includ...
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| creator | SHAHAR, Arie |
| description | A detector assembly 100 is provided that includes a semiconductor detector 110, a pinhole collimator 130, and a processing unit 150. The semiconductor detector 110 has a first surface 112 and a second surface 114 opposed to each other. The first surface includes pixels, and the second surface includes a cathode electrode. The pinhole collimator 130 includes an array of pinhole openings corresponding to the pixels. Each pinhole opening is associated with a single pixel of the semiconductor detector, and the area of each pinhole opening is smaller than a corresponding area of the corresponding pixel. The processing unit 150 is operably coupled to the semiconductor detector 110 and configured to identify detected events within virtual sub-pixels distributed along a length and width of the semiconductor detector 110. Each pixel includes a plurality of corresponding virtual sub-pixels (as interpreted by the processing unit), wherein absorbed photons are counted as events in a corresponding virtual sub-pixel. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3404448A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3404448A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3404448A13</originalsourceid><addsrcrecordid>eNrjZLAIjgwOcfUNVnD0c1HwdQ3x8HcJVnDzD1Lw9A0I8g9zdVFw9vfx8fR1DPH091MIdvUL9gzxDPMMieRhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuAcYmBiYmJhaOhsZEKAEAR_4ojw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEMS AND METHODS FOR IMPROVED COLLIMATION SENSITIVITY</title><source>esp@cenet</source><creator>SHAHAR, Arie</creator><creatorcontrib>SHAHAR, Arie</creatorcontrib><description>A detector assembly 100 is provided that includes a semiconductor detector 110, a pinhole collimator 130, and a processing unit 150. The semiconductor detector 110 has a first surface 112 and a second surface 114 opposed to each other. The first surface includes pixels, and the second surface includes a cathode electrode. The pinhole collimator 130 includes an array of pinhole openings corresponding to the pixels. Each pinhole opening is associated with a single pixel of the semiconductor detector, and the area of each pinhole opening is smaller than a corresponding area of the corresponding pixel. The processing unit 150 is operably coupled to the semiconductor detector 110 and configured to identify detected events within virtual sub-pixels distributed along a length and width of the semiconductor detector 110. Each pixel includes a plurality of corresponding virtual sub-pixels (as interpreted by the processing unit), wherein absorbed photons are counted as events in a corresponding virtual sub-pixel.</description><language>eng ; fre ; ger</language><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181121&DB=EPODOC&CC=EP&NR=3404448A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20181121&DB=EPODOC&CC=EP&NR=3404448A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SHAHAR, Arie</creatorcontrib><title>SYSTEMS AND METHODS FOR IMPROVED COLLIMATION SENSITIVITY</title><description>A detector assembly 100 is provided that includes a semiconductor detector 110, a pinhole collimator 130, and a processing unit 150. The semiconductor detector 110 has a first surface 112 and a second surface 114 opposed to each other. The first surface includes pixels, and the second surface includes a cathode electrode. The pinhole collimator 130 includes an array of pinhole openings corresponding to the pixels. Each pinhole opening is associated with a single pixel of the semiconductor detector, and the area of each pinhole opening is smaller than a corresponding area of the corresponding pixel. The processing unit 150 is operably coupled to the semiconductor detector 110 and configured to identify detected events within virtual sub-pixels distributed along a length and width of the semiconductor detector 110. Each pixel includes a plurality of corresponding virtual sub-pixels (as interpreted by the processing unit), wherein absorbed photons are counted as events in a corresponding virtual sub-pixel.</description><subject>MEASUREMENT OF NUCLEAR OR X-RADIATION</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAIjgwOcfUNVnD0c1HwdQ3x8HcJVnDzD1Lw9A0I8g9zdVFw9vfx8fR1DPH091MIdvUL9gzxDPMMieRhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuAcYmBiYmJhaOhsZEKAEAR_4ojw</recordid><startdate>20181121</startdate><enddate>20181121</enddate><creator>SHAHAR, Arie</creator><scope>EVB</scope></search><sort><creationdate>20181121</creationdate><title>SYSTEMS AND METHODS FOR IMPROVED COLLIMATION SENSITIVITY</title><author>SHAHAR, Arie</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3404448A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2018</creationdate><topic>MEASUREMENT OF NUCLEAR OR X-RADIATION</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SHAHAR, Arie</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SHAHAR, Arie</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEMS AND METHODS FOR IMPROVED COLLIMATION SENSITIVITY</title><date>2018-11-21</date><risdate>2018</risdate><abstract>A detector assembly 100 is provided that includes a semiconductor detector 110, a pinhole collimator 130, and a processing unit 150. The semiconductor detector 110 has a first surface 112 and a second surface 114 opposed to each other. The first surface includes pixels, and the second surface includes a cathode electrode. The pinhole collimator 130 includes an array of pinhole openings corresponding to the pixels. Each pinhole opening is associated with a single pixel of the semiconductor detector, and the area of each pinhole opening is smaller than a corresponding area of the corresponding pixel. The processing unit 150 is operably coupled to the semiconductor detector 110 and configured to identify detected events within virtual sub-pixels distributed along a length and width of the semiconductor detector 110. Each pixel includes a plurality of corresponding virtual sub-pixels (as interpreted by the processing unit), wherein absorbed photons are counted as events in a corresponding virtual sub-pixel.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING |
| title | SYSTEMS AND METHODS FOR IMPROVED COLLIMATION SENSITIVITY |
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