SYSTEM AND METHOD FOR DETECTING DEFECTS IN SPECULAR OR SEMI-SPECULAR SURFACES BY MEANS OF PHOTOGRAMMETRIC PROJECTION

The present invention relates to a system for defecting defects in specular or semi-specular surfaces of objects to be inspected, which is suitable for integration into an industrial production line and comprises: a plurality of light-emission means (1) for emitting light onto the objects; a plurality of cameras (2) for detecting the light reflected by the objects; a subsystem for control and photogrammetric analysis of information associated with the light emitted by the light-emission means (1) and with the light detected by the cameras (2); and a supporting structure (3) integrated into the production line of the objects to be inspected, the light-emission means (1) and the cameras (2) of the system being disposed on the structure. Advantageously, the light-emission means (1) are disposed in the system such that the light emitted onto the surface of the objects has a periodic pattern of light and shade, and the pattern is emitted with relative movement on the objects to be inspected, passing across the surface thereof.