SYSTEM AND METHOD FOR TESTING CHIP-ON-GLASS BONDING QUALITY
A system and method of testing chip-on-glass (COG) bonding quality automatically includes a glass panel comprising two test pads, the test pads electrically interconnected, a display driver comprising an input node and an output node, and an adhesive layer between the glass panel and the display dri...
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| creator | LOZA, Steven R HAN, Qian CHEN, Shunlin LUO, Guoping CHEN, Chuanning ZHU, Xiangan WU, Guangrong GARCIA, Jose |
| description | A system and method of testing chip-on-glass (COG) bonding quality automatically includes a glass panel comprising two test pads, the test pads electrically interconnected, a display driver comprising an input node and an output node, and an adhesive layer between the glass panel and the display driver, the adhesive layer binding the glass panel with the display driver, the adhesive layer comprising conductive portions across the adhesive layer between the glass panel and the display driver, wherein the input node, the output node, the two test pads, and the conductive portions are electrically connected to form an electrical testing loop, the electrical testing loop configured to measure a voltage drop across the conductive portions. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3384525B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3384525B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3384525B13</originalsourceid><addsrcrecordid>eNrjZLAOjgwOcfVVcPRzUfB1DfHwd1Fw8w9SCHENDvH0c1dw9vAM0PX303X3cQwOVnDy93MBiQaGOvp4hkTyMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JJ41wBjYwsTUyNTJ0NjIpQAAIj3KOU</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM AND METHOD FOR TESTING CHIP-ON-GLASS BONDING QUALITY</title><source>esp@cenet</source><creator>LOZA, Steven R ; HAN, Qian ; CHEN, Shunlin ; LUO, Guoping ; CHEN, Chuanning ; ZHU, Xiangan ; WU, Guangrong ; GARCIA, Jose</creator><creatorcontrib>LOZA, Steven R ; HAN, Qian ; CHEN, Shunlin ; LUO, Guoping ; CHEN, Chuanning ; ZHU, Xiangan ; WU, Guangrong ; GARCIA, Jose</creatorcontrib><description>A system and method of testing chip-on-glass (COG) bonding quality automatically includes a glass panel comprising two test pads, the test pads electrically interconnected, a display driver comprising an input node and an output node, and an adhesive layer between the glass panel and the display driver, the adhesive layer binding the glass panel with the display driver, the adhesive layer comprising conductive portions across the adhesive layer between the glass panel and the display driver, wherein the input node, the output node, the two test pads, and the conductive portions are electrically connected to form an electrical testing loop, the electrical testing loop configured to measure a voltage drop across the conductive portions.</description><language>eng ; fre ; ger</language><subject>ADVERTISING ; ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION ; BASIC ELECTRIC ELEMENTS ; CRYPTOGRAPHY ; DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ; DISPLAY ; EDUCATION ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; FREQUENCY-CHANGING ; NON-LINEAR OPTICS ; OPTICAL ANALOGUE/DIGITAL CONVERTERS ; OPTICAL LOGIC ELEMENTS ; OPTICS ; PHYSICS ; SEALS ; SEMICONDUCTOR DEVICES ; TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201007&DB=EPODOC&CC=EP&NR=3384525B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201007&DB=EPODOC&CC=EP&NR=3384525B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LOZA, Steven R</creatorcontrib><creatorcontrib>HAN, Qian</creatorcontrib><creatorcontrib>CHEN, Shunlin</creatorcontrib><creatorcontrib>LUO, Guoping</creatorcontrib><creatorcontrib>CHEN, Chuanning</creatorcontrib><creatorcontrib>ZHU, Xiangan</creatorcontrib><creatorcontrib>WU, Guangrong</creatorcontrib><creatorcontrib>GARCIA, Jose</creatorcontrib><title>SYSTEM AND METHOD FOR TESTING CHIP-ON-GLASS BONDING QUALITY</title><description>A system and method of testing chip-on-glass (COG) bonding quality automatically includes a glass panel comprising two test pads, the test pads electrically interconnected, a display driver comprising an input node and an output node, and an adhesive layer between the glass panel and the display driver, the adhesive layer binding the glass panel with the display driver, the adhesive layer comprising conductive portions across the adhesive layer between the glass panel and the display driver, wherein the input node, the output node, the two test pads, and the conductive portions are electrically connected to form an electrical testing loop, the electrical testing loop configured to measure a voltage drop across the conductive portions.</description><subject>ADVERTISING</subject><subject>ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CRYPTOGRAPHY</subject><subject>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</subject><subject>DISPLAY</subject><subject>EDUCATION</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FREQUENCY-CHANGING</subject><subject>NON-LINEAR OPTICS</subject><subject>OPTICAL ANALOGUE/DIGITAL CONVERTERS</subject><subject>OPTICAL LOGIC ELEMENTS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>SEALS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZLAOjgwOcfVVcPRzUfB1DfHwd1Fw8w9SCHENDvH0c1dw9vAM0PX303X3cQwOVnDy93MBiQaGOvp4hkTyMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JJ41wBjYwsTUyNTJ0NjIpQAAIj3KOU</recordid><startdate>20201007</startdate><enddate>20201007</enddate><creator>LOZA, Steven R</creator><creator>HAN, Qian</creator><creator>CHEN, Shunlin</creator><creator>LUO, Guoping</creator><creator>CHEN, Chuanning</creator><creator>ZHU, Xiangan</creator><creator>WU, Guangrong</creator><creator>GARCIA, Jose</creator><scope>EVB</scope></search><sort><creationdate>20201007</creationdate><title>SYSTEM AND METHOD FOR TESTING CHIP-ON-GLASS BONDING QUALITY</title><author>LOZA, Steven R ; HAN, Qian ; CHEN, Shunlin ; LUO, Guoping ; CHEN, Chuanning ; ZHU, Xiangan ; WU, Guangrong ; GARCIA, Jose</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3384525B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2020</creationdate><topic>ADVERTISING</topic><topic>ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CRYPTOGRAPHY</topic><topic>DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING</topic><topic>DISPLAY</topic><topic>EDUCATION</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FREQUENCY-CHANGING</topic><topic>NON-LINEAR OPTICS</topic><topic>OPTICAL ANALOGUE/DIGITAL CONVERTERS</topic><topic>OPTICAL LOGIC ELEMENTS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>SEALS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF</topic><toplevel>online_resources</toplevel><creatorcontrib>LOZA, Steven R</creatorcontrib><creatorcontrib>HAN, Qian</creatorcontrib><creatorcontrib>CHEN, Shunlin</creatorcontrib><creatorcontrib>LUO, Guoping</creatorcontrib><creatorcontrib>CHEN, Chuanning</creatorcontrib><creatorcontrib>ZHU, Xiangan</creatorcontrib><creatorcontrib>WU, Guangrong</creatorcontrib><creatorcontrib>GARCIA, Jose</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>LOZA, Steven R</au><au>HAN, Qian</au><au>CHEN, Shunlin</au><au>LUO, Guoping</au><au>CHEN, Chuanning</au><au>ZHU, Xiangan</au><au>WU, Guangrong</au><au>GARCIA, Jose</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM AND METHOD FOR TESTING CHIP-ON-GLASS BONDING QUALITY</title><date>2020-10-07</date><risdate>2020</risdate><abstract>A system and method of testing chip-on-glass (COG) bonding quality automatically includes a glass panel comprising two test pads, the test pads electrically interconnected, a display driver comprising an input node and an output node, and an adhesive layer between the glass panel and the display driver, the adhesive layer binding the glass panel with the display driver, the adhesive layer comprising conductive portions across the adhesive layer between the glass panel and the display driver, wherein the input node, the output node, the two test pads, and the conductive portions are electrically connected to form an electrical testing loop, the electrical testing loop configured to measure a voltage drop across the conductive portions.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | ADVERTISING ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICESUSING STATIC MEANS TO PRESENT VARIABLE INFORMATION BASIC ELECTRIC ELEMENTS CRYPTOGRAPHY DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING DISPLAY EDUCATION ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY FREQUENCY-CHANGING NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS SEALS SEMICONDUCTOR DEVICES TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF |
| title | SYSTEM AND METHOD FOR TESTING CHIP-ON-GLASS BONDING QUALITY |
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