METHOD AND SYSTEM FOR DETERMINING CIRCUIT FAILURE RATE

A method involves determining failure in time rate for a circuit. The method may include obtaining circuit data regarding a circuit. The circuit may include a first wire segment and a second wire segment. The method may further include obtaining reliability data. The reliability data may describe a...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SARASWAT, Govind, AU, Wai, Chung William, STANLEY, Douglas, TRIVEDI, Anuj
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS
Online-Zugang:	Volltext bestellen
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