METHOD AND SYSTEM FOR DETERMINING CIRCUIT FAILURE RATE

METHOD AND SYSTEM FOR DETERMINING CIRCUIT FAILURE RATE

A method involves determining failure in time rate for a circuit. The method may include obtaining circuit data regarding a circuit. The circuit may include a first wire segment and a second wire segment. The method may further include obtaining reliability data. The reliability data may describe a...

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Hauptverfasser: SARASWAT, Govind, AU, Wai, Chung William, STANLEY, Douglas, TRIVEDI, Anuj
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator SARASWAT, Govind
AU, Wai, Chung William
STANLEY, Douglas
TRIVEDI, Anuj
description A method involves determining failure in time rate for a circuit. The method may include obtaining circuit data regarding a circuit. The circuit may include a first wire segment and a second wire segment. The method may further include obtaining reliability data. The reliability data may describe a failure of the circuit over a pre-determined time period. The method may further include obtaining a thermal map. The method may further include determining a first failure rate for the first wire segment of the circuit. The first failure rate may be a probability that the first wire segment fails in a predetermined amount of time. The method may further include determining a second failure rate for the second wire segment of the circuit. The method may further include generating a model of the circuit. The model of the circuit may describe the first and the second failure rate of the circuit.
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title METHOD AND SYSTEM FOR DETERMINING CIRCUIT FAILURE RATE
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