SCANNING TRANSMISSION ELECTRON MICROSCOPE WITH A CONDENSER OBJECTIVE SYSTEM AND A METHOD OF USE THEREOF

SCANNING TRANSMISSION ELECTRON MICROSCOPE WITH A CONDENSER OBJECTIVE SYSTEM AND A METHOD OF USE THEREOF

The object of the present invention provides a scanning transmission electron microscope with the ability to adjust a beam current. The scanning transmission electron microscope comprises an electron source, which is configured to provide a primary electron beam with a cross-over, a condenser lens s...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Petras, Stanislav, Benner, Gerd Ludwig, Lencová, Bohumila, Weiss, Jon Karl
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Petras, Stanislav
Benner, Gerd Ludwig
Lencová, Bohumila
Weiss, Jon Karl
description The object of the present invention provides a scanning transmission electron microscope with the ability to adjust a beam current. The scanning transmission electron microscope comprises an electron source, which is configured to provide a primary electron beam with a cross-over, a condenser lens system, an objective electromagnetic lens and a detection system. A salient feature of presented invention is the partition of the condenser system lens into the first condenser lens and the system of second and third condenser lenses. Such a partition allows to place a condenser aperture between the first condenser lens and the condenser zoom system. Presented arrangement thus allows to adjust the beam current independently on the magnification of effective spot size.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3379556A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3379556A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3379556A13</originalsourceid><addsrcrecordid>eNqNyrEKwjAQgOEuDqK-w72Ag5QqjjG5moi5K7lTcSpFootoob4_dvABnP5_-KbFQ6whCrQHTYYkBpHABHhEq2mcGGxisdwgXIJ6MGCZHJJgAt4dRhXOCHIVxQiG3AgiqmcHXMNJENRjQq7nxeTePYe8-HVWQI1q_TL37zYPfXfLr_xpsSnLzbaq1mZV_kG-ojk1Dw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SCANNING TRANSMISSION ELECTRON MICROSCOPE WITH A CONDENSER OBJECTIVE SYSTEM AND A METHOD OF USE THEREOF</title><source>esp@cenet</source><creator>Petras, Stanislav ; Benner, Gerd Ludwig ; Lencová, Bohumila ; Weiss, Jon Karl</creator><creatorcontrib>Petras, Stanislav ; Benner, Gerd Ludwig ; Lencová, Bohumila ; Weiss, Jon Karl</creatorcontrib><description>The object of the present invention provides a scanning transmission electron microscope with the ability to adjust a beam current. The scanning transmission electron microscope comprises an electron source, which is configured to provide a primary electron beam with a cross-over, a condenser lens system, an objective electromagnetic lens and a detection system. A salient feature of presented invention is the partition of the condenser system lens into the first condenser lens and the system of second and third condenser lenses. Such a partition allows to place a condenser aperture between the first condenser lens and the condenser zoom system. Presented arrangement thus allows to adjust the beam current independently on the magnification of effective spot size.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180926&amp;DB=EPODOC&amp;CC=EP&amp;NR=3379556A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180926&amp;DB=EPODOC&amp;CC=EP&amp;NR=3379556A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Petras, Stanislav</creatorcontrib><creatorcontrib>Benner, Gerd Ludwig</creatorcontrib><creatorcontrib>Lencová, Bohumila</creatorcontrib><creatorcontrib>Weiss, Jon Karl</creatorcontrib><title>SCANNING TRANSMISSION ELECTRON MICROSCOPE WITH A CONDENSER OBJECTIVE SYSTEM AND A METHOD OF USE THEREOF</title><description>The object of the present invention provides a scanning transmission electron microscope with the ability to adjust a beam current. The scanning transmission electron microscope comprises an electron source, which is configured to provide a primary electron beam with a cross-over, a condenser lens system, an objective electromagnetic lens and a detection system. A salient feature of presented invention is the partition of the condenser system lens into the first condenser lens and the system of second and third condenser lenses. Such a partition allows to place a condenser aperture between the first condenser lens and the condenser zoom system. Presented arrangement thus allows to adjust the beam current independently on the magnification of effective spot size.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQgOEuDqK-w72Ag5QqjjG5moi5K7lTcSpFootoob4_dvABnP5_-KbFQ6whCrQHTYYkBpHABHhEq2mcGGxisdwgXIJ6MGCZHJJgAt4dRhXOCHIVxQiG3AgiqmcHXMNJENRjQq7nxeTePYe8-HVWQI1q_TL37zYPfXfLr_xpsSnLzbaq1mZV_kG-ojk1Dw</recordid><startdate>20180926</startdate><enddate>20180926</enddate><creator>Petras, Stanislav</creator><creator>Benner, Gerd Ludwig</creator><creator>Lencová, Bohumila</creator><creator>Weiss, Jon Karl</creator><scope>EVB</scope></search><sort><creationdate>20180926</creationdate><title>SCANNING TRANSMISSION ELECTRON MICROSCOPE WITH A CONDENSER OBJECTIVE SYSTEM AND A METHOD OF USE THEREOF</title><author>Petras, Stanislav ; Benner, Gerd Ludwig ; Lencová, Bohumila ; Weiss, Jon Karl</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3379556A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2018</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><toplevel>online_resources</toplevel><creatorcontrib>Petras, Stanislav</creatorcontrib><creatorcontrib>Benner, Gerd Ludwig</creatorcontrib><creatorcontrib>Lencová, Bohumila</creatorcontrib><creatorcontrib>Weiss, Jon Karl</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Petras, Stanislav</au><au>Benner, Gerd Ludwig</au><au>Lencová, Bohumila</au><au>Weiss, Jon Karl</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SCANNING TRANSMISSION ELECTRON MICROSCOPE WITH A CONDENSER OBJECTIVE SYSTEM AND A METHOD OF USE THEREOF</title><date>2018-09-26</date><risdate>2018</risdate><abstract>The object of the present invention provides a scanning transmission electron microscope with the ability to adjust a beam current. The scanning transmission electron microscope comprises an electron source, which is configured to provide a primary electron beam with a cross-over, a condenser lens system, an objective electromagnetic lens and a detection system. A salient feature of presented invention is the partition of the condenser system lens into the first condenser lens and the system of second and third condenser lenses. Such a partition allows to place a condenser aperture between the first condenser lens and the condenser zoom system. Presented arrangement thus allows to adjust the beam current independently on the magnification of effective spot size.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP3379556A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
title SCANNING TRANSMISSION ELECTRON MICROSCOPE WITH A CONDENSER OBJECTIVE SYSTEM AND A METHOD OF USE THEREOF
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-24T02%3A27%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Petras,%20Stanislav&rft.date=2018-09-26&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3379556A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true