SCANNING TRANSMISSION ELECTRON MICROSCOPE

SCANNING TRANSMISSION ELECTRON MICROSCOPE

A scanning transmission electron microscope is adapted to acquire high quality precession electron diffraction (PED) patterns by means of separated scanning deflectors and precession deflectors. Magnetic or electrostatic deflectors may be used for scanning and for precession. This enables independen...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Petras, Stanislav, Benner, Gerd Ludwig, Lencová, Bohumila, Weiss, Jon Karl
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Petras, Stanislav
Benner, Gerd Ludwig
Lencová, Bohumila
Weiss, Jon Karl
description A scanning transmission electron microscope is adapted to acquire high quality precession electron diffraction (PED) patterns by means of separated scanning deflectors and precession deflectors. Magnetic or electrostatic deflectors may be used for scanning and for precession. This enables independent optimization of parameters for each deflection system to achieve a broad operating range simultaneously for both deflection systems.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3379236B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3379236B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3379236B13</originalsourceid><addsrcrecordid>eNrjZNAMdnb08_P0c1cICXL0C_b1DA729PdTcPVxdQ4JAjJ8PZ2D_IOd_QNceRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJvGuAsbG5pZGxmZOhMRFKABChJGc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SCANNING TRANSMISSION ELECTRON MICROSCOPE</title><source>esp@cenet</source><creator>Petras, Stanislav ; Benner, Gerd Ludwig ; Lencová, Bohumila ; Weiss, Jon Karl</creator><creatorcontrib>Petras, Stanislav ; Benner, Gerd Ludwig ; Lencová, Bohumila ; Weiss, Jon Karl</creatorcontrib><description>A scanning transmission electron microscope is adapted to acquire high quality precession electron diffraction (PED) patterns by means of separated scanning deflectors and precession deflectors. Magnetic or electrostatic deflectors may be used for scanning and for precession. This enables independent optimization of parameters for each deflection system to achieve a broad operating range simultaneously for both deflection systems.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2019</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190911&amp;DB=EPODOC&amp;CC=EP&amp;NR=3379236B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20190911&amp;DB=EPODOC&amp;CC=EP&amp;NR=3379236B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Petras, Stanislav</creatorcontrib><creatorcontrib>Benner, Gerd Ludwig</creatorcontrib><creatorcontrib>Lencová, Bohumila</creatorcontrib><creatorcontrib>Weiss, Jon Karl</creatorcontrib><title>SCANNING TRANSMISSION ELECTRON MICROSCOPE</title><description>A scanning transmission electron microscope is adapted to acquire high quality precession electron diffraction (PED) patterns by means of separated scanning deflectors and precession deflectors. Magnetic or electrostatic deflectors may be used for scanning and for precession. This enables independent optimization of parameters for each deflection system to achieve a broad operating range simultaneously for both deflection systems.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2019</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAMdnb08_P0c1cICXL0C_b1DA729PdTcPVxdQ4JAjJ8PZ2D_IOd_QNceRhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJvGuAsbG5pZGxmZOhMRFKABChJGc</recordid><startdate>20190911</startdate><enddate>20190911</enddate><creator>Petras, Stanislav</creator><creator>Benner, Gerd Ludwig</creator><creator>Lencová, Bohumila</creator><creator>Weiss, Jon Karl</creator><scope>EVB</scope></search><sort><creationdate>20190911</creationdate><title>SCANNING TRANSMISSION ELECTRON MICROSCOPE</title><author>Petras, Stanislav ; Benner, Gerd Ludwig ; Lencová, Bohumila ; Weiss, Jon Karl</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3379236B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2019</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Petras, Stanislav</creatorcontrib><creatorcontrib>Benner, Gerd Ludwig</creatorcontrib><creatorcontrib>Lencová, Bohumila</creatorcontrib><creatorcontrib>Weiss, Jon Karl</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Petras, Stanislav</au><au>Benner, Gerd Ludwig</au><au>Lencová, Bohumila</au><au>Weiss, Jon Karl</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SCANNING TRANSMISSION ELECTRON MICROSCOPE</title><date>2019-09-11</date><risdate>2019</risdate><abstract>A scanning transmission electron microscope is adapted to acquire high quality precession electron diffraction (PED) patterns by means of separated scanning deflectors and precession deflectors. Magnetic or electrostatic deflectors may be used for scanning and for precession. This enables independent optimization of parameters for each deflection system to achieve a broad operating range simultaneously for both deflection systems.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP3379236B1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
ELECTRICITY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SCANNING TRANSMISSION ELECTRON MICROSCOPE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-19T13%3A53%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Petras,%20Stanislav&rft.date=2019-09-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3379236B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true