ARCHITECTURE FOR TELEMETRY AND ADAPTIVE LIFETIME CONTROL OF INTEGRATED CIRCUITS

Apparatus, method, and system for remotely affecting the functionality and lifetime of an integrated circuit are described herein. One embodiment of a method includes: tracking a plurality of operational metrics relating to a monitored device, sending one or more of the plurality of operational metr...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: GILL, Balkaran, SINDIA, Suraj, KWASNICK, Robert F, VANDAM, Clark N
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator GILL, Balkaran
SINDIA, Suraj
KWASNICK, Robert F
VANDAM, Clark N
description Apparatus, method, and system for remotely affecting the functionality and lifetime of an integrated circuit are described herein. One embodiment of a method includes: tracking a plurality of operational metrics relating to a monitored device, sending one or more of the plurality of operational metrics to a remote monitor and responsively receiving a command generated by the remote monitor, generating a threat level based on the plurality of operational metrics and the command, and performing a derating action based on the threat level. The command from the remote monitor may be generated by the remote monitor based, at least in part, on the one or more of the plurality of operational metrics. Alternatively, the command may be generated based on information obtained independently by the remote monitor and not based on the one or more of the plurality of operational metrics.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3343428A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3343428A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3343428A13</originalsourceid><addsrcrecordid>eNqNyzEOwjAMQNEuDAi4gy_AAOnAajkOtZQmlXGROlUVChOCSuX-goEDMP3l_XWVUakRY7JeGUJWMI7csukAmDygx87kyhAlsEnLQDmZ5gg5gCTjs6KxBxKlXuyyrVb36bGU3a-bCr4fNfsyv8ayzNOtPMt75M652tXHEx7cH-QD_0YujA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ARCHITECTURE FOR TELEMETRY AND ADAPTIVE LIFETIME CONTROL OF INTEGRATED CIRCUITS</title><source>esp@cenet</source><creator>GILL, Balkaran ; SINDIA, Suraj ; KWASNICK, Robert F ; VANDAM, Clark N</creator><creatorcontrib>GILL, Balkaran ; SINDIA, Suraj ; KWASNICK, Robert F ; VANDAM, Clark N</creatorcontrib><description>Apparatus, method, and system for remotely affecting the functionality and lifetime of an integrated circuit are described herein. One embodiment of a method includes: tracking a plurality of operational metrics relating to a monitored device, sending one or more of the plurality of operational metrics to a remote monitor and responsively receiving a command generated by the remote monitor, generating a threat level based on the plurality of operational metrics and the command, and performing a derating action based on the threat level. The command from the remote monitor may be generated by the remote monitor based, at least in part, on the one or more of the plurality of operational metrics. Alternatively, the command may be generated based on information obtained independently by the remote monitor and not based on the one or more of the plurality of operational metrics.</description><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2018</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180704&amp;DB=EPODOC&amp;CC=EP&amp;NR=3343428A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,309,781,886,25566,76549</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20180704&amp;DB=EPODOC&amp;CC=EP&amp;NR=3343428A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>GILL, Balkaran</creatorcontrib><creatorcontrib>SINDIA, Suraj</creatorcontrib><creatorcontrib>KWASNICK, Robert F</creatorcontrib><creatorcontrib>VANDAM, Clark N</creatorcontrib><title>ARCHITECTURE FOR TELEMETRY AND ADAPTIVE LIFETIME CONTROL OF INTEGRATED CIRCUITS</title><description>Apparatus, method, and system for remotely affecting the functionality and lifetime of an integrated circuit are described herein. One embodiment of a method includes: tracking a plurality of operational metrics relating to a monitored device, sending one or more of the plurality of operational metrics to a remote monitor and responsively receiving a command generated by the remote monitor, generating a threat level based on the plurality of operational metrics and the command, and performing a derating action based on the threat level. The command from the remote monitor may be generated by the remote monitor based, at least in part, on the one or more of the plurality of operational metrics. Alternatively, the command may be generated based on information obtained independently by the remote monitor and not based on the one or more of the plurality of operational metrics.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2018</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyzEOwjAMQNEuDAi4gy_AAOnAajkOtZQmlXGROlUVChOCSuX-goEDMP3l_XWVUakRY7JeGUJWMI7csukAmDygx87kyhAlsEnLQDmZ5gg5gCTjs6KxBxKlXuyyrVb36bGU3a-bCr4fNfsyv8ayzNOtPMt75M652tXHEx7cH-QD_0YujA</recordid><startdate>20180704</startdate><enddate>20180704</enddate><creator>GILL, Balkaran</creator><creator>SINDIA, Suraj</creator><creator>KWASNICK, Robert F</creator><creator>VANDAM, Clark N</creator><scope>EVB</scope></search><sort><creationdate>20180704</creationdate><title>ARCHITECTURE FOR TELEMETRY AND ADAPTIVE LIFETIME CONTROL OF INTEGRATED CIRCUITS</title><author>GILL, Balkaran ; SINDIA, Suraj ; KWASNICK, Robert F ; VANDAM, Clark N</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3343428A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2018</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>GILL, Balkaran</creatorcontrib><creatorcontrib>SINDIA, Suraj</creatorcontrib><creatorcontrib>KWASNICK, Robert F</creatorcontrib><creatorcontrib>VANDAM, Clark N</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>GILL, Balkaran</au><au>SINDIA, Suraj</au><au>KWASNICK, Robert F</au><au>VANDAM, Clark N</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ARCHITECTURE FOR TELEMETRY AND ADAPTIVE LIFETIME CONTROL OF INTEGRATED CIRCUITS</title><date>2018-07-04</date><risdate>2018</risdate><abstract>Apparatus, method, and system for remotely affecting the functionality and lifetime of an integrated circuit are described herein. One embodiment of a method includes: tracking a plurality of operational metrics relating to a monitored device, sending one or more of the plurality of operational metrics to a remote monitor and responsively receiving a command generated by the remote monitor, generating a threat level based on the plurality of operational metrics and the command, and performing a derating action based on the threat level. The command from the remote monitor may be generated by the remote monitor based, at least in part, on the one or more of the plurality of operational metrics. Alternatively, the command may be generated based on information obtained independently by the remote monitor and not based on the one or more of the plurality of operational metrics.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP3343428A1
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title ARCHITECTURE FOR TELEMETRY AND ADAPTIVE LIFETIME CONTROL OF INTEGRATED CIRCUITS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-17T21%3A58%3A30IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=GILL,%20Balkaran&rft.date=2018-07-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3343428A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true