CIRCUIT ARRANGEMENT FOR A SECURE DIGITAL SWITCHED OUTPUT, TEST METHOD FOR - AND OUTPUT MODULE COMPRISING A DIGITAL CIRCUIT ARRANGEMENT OF THIS TYPE
A circuit for a digital switched output for connecting a load which can be connected between the switched output and another output includes at least one semiconductor switch arranged with a clearance between contacts between a supply voltage connection and the switched output. At least one semicond...
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creator | ROSE, Gorm |
description | A circuit for a digital switched output for connecting a load which can be connected between the switched output and another output includes at least one semiconductor switch arranged with a clearance between contacts between a supply voltage connection and the switched output. At least one semiconductor switch is connected to the switched output via an inductor wherein a connecting node between the semiconductor switch and the inductor is connected to the other output via a free-running element. An output module provides automated control of the circuit. A method for testing the circuit includes controlling the semiconductor switch for operation of the load, interrupting the controlling, operating the load with energy stored in the inductor, determining whether voltage is prevented from being supplied to the load, and further controlling the semiconductor switch for further operation of the load. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3314765B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3314765B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3314765B13</originalsourceid><addsrcrecordid>eNqNjTsOwjAQRNNQIOAOewBSROFTG3uTrBR_ZK-FqKIImQpBpHATLkyEoKOgmmJm3ptnT0leRmIQ3gtTo0bDUFkPAgLK6BEU1cSihXAklg0qsJFd5DUwBgaN3Fj1fuQgzLcFbVVsEaTVzlMgU0_AL-mX0lbADQXgk8NlNrv01zGtPrnIoMLJnafh3qVx6M_plh4durIsNvvd9lCUf0xeZ1dAuQ</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CIRCUIT ARRANGEMENT FOR A SECURE DIGITAL SWITCHED OUTPUT, TEST METHOD FOR - AND OUTPUT MODULE COMPRISING A DIGITAL CIRCUIT ARRANGEMENT OF THIS TYPE</title><source>esp@cenet</source><creator>ROSE, Gorm</creator><creatorcontrib>ROSE, Gorm</creatorcontrib><description>A circuit for a digital switched output for connecting a load which can be connected between the switched output and another output includes at least one semiconductor switch arranged with a clearance between contacts between a supply voltage connection and the switched output. At least one semiconductor switch is connected to the switched output via an inductor wherein a connecting node between the semiconductor switch and the inductor is connected to the other output via a free-running element. An output module provides automated control of the circuit. A method for testing the circuit includes controlling the semiconductor switch for operation of the load, interrupting the controlling, operating the load with energy stored in the inductor, determining whether voltage is prevented from being supplied to the load, and further controlling the semiconductor switch for further operation of the load.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRONIC CIRCUITRY ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PULSE TECHNIQUE ; TESTING</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220504&DB=EPODOC&CC=EP&NR=3314765B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20220504&DB=EPODOC&CC=EP&NR=3314765B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ROSE, Gorm</creatorcontrib><title>CIRCUIT ARRANGEMENT FOR A SECURE DIGITAL SWITCHED OUTPUT, TEST METHOD FOR - AND OUTPUT MODULE COMPRISING A DIGITAL CIRCUIT ARRANGEMENT OF THIS TYPE</title><description>A circuit for a digital switched output for connecting a load which can be connected between the switched output and another output includes at least one semiconductor switch arranged with a clearance between contacts between a supply voltage connection and the switched output. At least one semiconductor switch is connected to the switched output via an inductor wherein a connecting node between the semiconductor switch and the inductor is connected to the other output via a free-running element. An output module provides automated control of the circuit. A method for testing the circuit includes controlling the semiconductor switch for operation of the load, interrupting the controlling, operating the load with energy stored in the inductor, determining whether voltage is prevented from being supplied to the load, and further controlling the semiconductor switch for further operation of the load.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PULSE TECHNIQUE</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjTsOwjAQRNNQIOAOewBSROFTG3uTrBR_ZK-FqKIImQpBpHATLkyEoKOgmmJm3ptnT0leRmIQ3gtTo0bDUFkPAgLK6BEU1cSihXAklg0qsJFd5DUwBgaN3Fj1fuQgzLcFbVVsEaTVzlMgU0_AL-mX0lbADQXgk8NlNrv01zGtPrnIoMLJnafh3qVx6M_plh4durIsNvvd9lCUf0xeZ1dAuQ</recordid><startdate>20220504</startdate><enddate>20220504</enddate><creator>ROSE, Gorm</creator><scope>EVB</scope></search><sort><creationdate>20220504</creationdate><title>CIRCUIT ARRANGEMENT FOR A SECURE DIGITAL SWITCHED OUTPUT, TEST METHOD FOR - AND OUTPUT MODULE COMPRISING A DIGITAL CIRCUIT ARRANGEMENT OF THIS TYPE</title><author>ROSE, Gorm</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3314765B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2022</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PULSE TECHNIQUE</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ROSE, Gorm</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ROSE, Gorm</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CIRCUIT ARRANGEMENT FOR A SECURE DIGITAL SWITCHED OUTPUT, TEST METHOD FOR - AND OUTPUT MODULE COMPRISING A DIGITAL CIRCUIT ARRANGEMENT OF THIS TYPE</title><date>2022-05-04</date><risdate>2022</risdate><abstract>A circuit for a digital switched output for connecting a load which can be connected between the switched output and another output includes at least one semiconductor switch arranged with a clearance between contacts between a supply voltage connection and the switched output. At least one semiconductor switch is connected to the switched output via an inductor wherein a connecting node between the semiconductor switch and the inductor is connected to the other output via a free-running element. An output module provides automated control of the circuit. A method for testing the circuit includes controlling the semiconductor switch for operation of the load, interrupting the controlling, operating the load with energy stored in the inductor, determining whether voltage is prevented from being supplied to the load, and further controlling the semiconductor switch for further operation of the load.</abstract><oa>free_for_read</oa></addata></record> |
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language | eng ; fre ; ger |
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subjects | BASIC ELECTRONIC CIRCUITRY ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING |
title | CIRCUIT ARRANGEMENT FOR A SECURE DIGITAL SWITCHED OUTPUT, TEST METHOD FOR - AND OUTPUT MODULE COMPRISING A DIGITAL CIRCUIT ARRANGEMENT OF THIS TYPE |
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