METHOD AND APPARATUS FOR IDENTIFYING SENSITIVE INTEGRATED CIRCUIT PARTS TO RANDOM TELEGRAPH SIGNAL

METHOD AND APPARATUS FOR IDENTIFYING SENSITIVE INTEGRATED CIRCUIT PARTS TO RANDOM TELEGRAPH SIGNAL

In accordance with embodiments of the present disclosure, a method for identifying a location of an integrated circuit that is sensitive to RTS noise may include applying localized heat to a scan area of the integrated circuit, observing any change in one or more electrical parameters of the integra...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: BALASUNDARAM, Ramya, DOUGHERTY, Justin, BRENNAN, Aaron, MELANSON, John
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:In accordance with embodiments of the present disclosure, a method for identifying a location of an integrated circuit that is sensitive to RTS noise may include applying localized heat to a scan area of the integrated circuit, observing any change in one or more electrical parameters of the integrated circuit in response to the localized heat being applied to the scan area indicative of sensitivity to RTS noise, and identifying the location sensitive to RTS noise responsive to observing change in one or more electrical parameters of the integrated circuit indicative of sensitivity to RTS noise in response to the localized heat being applied to the scan area.