SENSOR FOR NON-DESTRUCTIVE CHARACTERIZATION OF OBJECTS
The present invention relates to a millimeter or terahertz wave sensor for providing inline inspection, preferably including but not limited to continuous monitoring of objects, for example thin sheet dielectric material.
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| creator | DEFERM, Noël REDANT, Tom REYNAERT, Patrick DEHAENE, Wim |
| description | The present invention relates to a millimeter or terahertz wave sensor for providing inline inspection, preferably including but not limited to continuous monitoring of objects, for example thin sheet dielectric material. |
| format | Patent |
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| language | eng ; fre ; ger |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING |
| title | SENSOR FOR NON-DESTRUCTIVE CHARACTERIZATION OF OBJECTS |
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