DETECTION DEVICE AND DETECTION METHOD
A detection apparatus is capable of improving abnormality detection accuracy after start of an inspection operation while reducing the amount of work that is done before the start of the operation. The apparatus includes an object characteristic storage device 2 that stores a parameter indicating a...
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| creator | TSUTADA, Hiroyuki KONDO, Junji IRIE, Megumi |
| description | A detection apparatus is capable of improving abnormality detection accuracy after start of an inspection operation while reducing the amount of work that is done before the start of the operation. The apparatus includes an object characteristic storage device 2 that stores a parameter indicating a characteristic of an abnormal object, an object detection unit 3 that detects an abnormal object candidate from image information by using the parameter, an object storage unit 4 that stores the abnormal object candidate, an object display unit 5 that displays the abnormal object candidate stored in the object storage unit 4, a calibration input unit 6 that receives input of calibration information on the abnormal object candidate, and, based on the calibration information, corrects the abnormal object candidate stored in the object storage unit 4, and an object characteristic calibration unit 7 that calibrates the parameter stored in the object characteristic storage device 2, based on the calibration information received by the calibration input unit 6. |
| format | Patent |
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The apparatus includes an object characteristic storage device 2 that stores a parameter indicating a characteristic of an abnormal object, an object detection unit 3 that detects an abnormal object candidate from image information by using the parameter, an object storage unit 4 that stores the abnormal object candidate, an object display unit 5 that displays the abnormal object candidate stored in the object storage unit 4, a calibration input unit 6 that receives input of calibration information on the abnormal object candidate, and, based on the calibration information, corrects the abnormal object candidate stored in the object storage unit 4, and an object characteristic calibration unit 7 that calibrates the parameter stored in the object characteristic storage device 2, based on the calibration information received by the calibration input unit 6.</description><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211222&DB=EPODOC&CC=EP&NR=3296722B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20211222&DB=EPODOC&CC=EP&NR=3296722B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TSUTADA, Hiroyuki</creatorcontrib><creatorcontrib>KONDO, Junji</creatorcontrib><creatorcontrib>IRIE, Megumi</creatorcontrib><title>DETECTION DEVICE AND DETECTION METHOD</title><description>A detection apparatus is capable of improving abnormality detection accuracy after start of an inspection operation while reducing the amount of work that is done before the start of the operation. The apparatus includes an object characteristic storage device 2 that stores a parameter indicating a characteristic of an abnormal object, an object detection unit 3 that detects an abnormal object candidate from image information by using the parameter, an object storage unit 4 that stores the abnormal object candidate, an object display unit 5 that displays the abnormal object candidate stored in the object storage unit 4, a calibration input unit 6 that receives input of calibration information on the abnormal object candidate, and, based on the calibration information, corrects the abnormal object candidate stored in the object storage unit 4, and an object characteristic calibration unit 7 that calibrates the parameter stored in the object characteristic storage device 2, based on the calibration information received by the calibration input unit 6.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFB1cQ1xdQ7x9PdTcHEN83R2VXD0c1FACPq6hnj4u_AwsKYl5hSn8kJpbgYFN9cQZw_d1IL8-NTigsTk1LzUknjXAGMjSzNzIyMnQ2MilAAAR_sitg</recordid><startdate>20211222</startdate><enddate>20211222</enddate><creator>TSUTADA, Hiroyuki</creator><creator>KONDO, Junji</creator><creator>IRIE, Megumi</creator><scope>EVB</scope></search><sort><creationdate>20211222</creationdate><title>DETECTION DEVICE AND DETECTION METHOD</title><author>TSUTADA, Hiroyuki ; KONDO, Junji ; IRIE, Megumi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3296722B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2021</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TSUTADA, Hiroyuki</creatorcontrib><creatorcontrib>KONDO, Junji</creatorcontrib><creatorcontrib>IRIE, Megumi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TSUTADA, Hiroyuki</au><au>KONDO, Junji</au><au>IRIE, Megumi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DETECTION DEVICE AND DETECTION METHOD</title><date>2021-12-22</date><risdate>2021</risdate><abstract>A detection apparatus is capable of improving abnormality detection accuracy after start of an inspection operation while reducing the amount of work that is done before the start of the operation. 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| subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | DETECTION DEVICE AND DETECTION METHOD |
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