METHOD OF MEASURING LOCAL ELECTRICAL FIELDS USING A SCANNING PROBE MICROSCOPE

A scanning probe microscope includes a tip. A quantum dot is applied to the tip.

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Bibliographische Detailangaben
Hauptverfasser:	TAUTZ, Frank, Stefan, WAGNER, Christian, TEMIROV, Ruslan, GREEN, Matthew, Felix, Blishen
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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Beschreibung
Zusammenfassung:	A scanning probe microscope includes a tip. A quantum dot is applied to the tip.