CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS

In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the rep...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: RADER, William, PULLEN, Stuart
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator RADER, William
PULLEN, Stuart
description In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the replica transistor. A differential amplifier provides a level shifted differential replica voltage to a tap of a resistor ladder of a successive approximation register analog-to-digital converter in response to the sampled voltage across the replica transistor. A current source provides a current to a top of the resistor ladder.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3250933A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3250933A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3250933A13</originalsourceid><addsrcrecordid>eNqNyrEKwjAQgOEsDqK-Q14goAYHx3Be40HNhUsaupUicRIt1PdHBR_A6R_-b6kKsAhCJg4aSKCjnHTDolMHgClRQeNiFO7p4r7KCHpKGUW74Fr2JrM5kafsWg0cCsrnpbVa3Mb7XDe_rpRuMMPZ1Ok51Hkar_VRXwNGuz9sj9a6nf2DvAGdtDEb</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS</title><source>esp@cenet</source><creator>RADER, William ; PULLEN, Stuart</creator><creatorcontrib>RADER, William ; PULLEN, Stuart</creatorcontrib><description>In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the replica transistor. A differential amplifier provides a level shifted differential replica voltage to a tap of a resistor ladder of a successive approximation register analog-to-digital converter in response to the sampled voltage across the replica transistor. A current source provides a current to a top of the resistor ladder.</description><language>eng ; fre ; ger</language><subject>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS ; BASIC ELECTRONIC CIRCUITRY ; CODE CONVERSION IN GENERAL ; CODING ; CONTROL OR REGULATION THEREOF ; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER ; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ; DECODING ; ELECTRICITY ; GENERATION ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20171206&amp;DB=EPODOC&amp;CC=EP&amp;NR=3250933A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20171206&amp;DB=EPODOC&amp;CC=EP&amp;NR=3250933A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>RADER, William</creatorcontrib><creatorcontrib>PULLEN, Stuart</creatorcontrib><title>CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS</title><description>In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the replica transistor. A differential amplifier provides a level shifted differential replica voltage to a tap of a resistor ladder of a successive approximation register analog-to-digital converter in response to the sampled voltage across the replica transistor. A current source provides a current to a top of the resistor ladder.</description><subject>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>CONTROL OR REGULATION THEREOF</subject><subject>CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER</subject><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</subject><subject>DECODING</subject><subject>ELECTRICITY</subject><subject>GENERATION</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQgOEsDqK-Q14goAYHx3Be40HNhUsaupUicRIt1PdHBR_A6R_-b6kKsAhCJg4aSKCjnHTDolMHgClRQeNiFO7p4r7KCHpKGUW74Fr2JrM5kafsWg0cCsrnpbVa3Mb7XDe_rpRuMMPZ1Ok51Hkar_VRXwNGuz9sj9a6nf2DvAGdtDEb</recordid><startdate>20171206</startdate><enddate>20171206</enddate><creator>RADER, William</creator><creator>PULLEN, Stuart</creator><scope>EVB</scope></search><sort><creationdate>20171206</creationdate><title>CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS</title><author>RADER, William ; PULLEN, Stuart</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3250933A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2017</creationdate><topic>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>CONTROL OR REGULATION THEREOF</topic><topic>CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER</topic><topic>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</topic><topic>DECODING</topic><topic>ELECTRICITY</topic><topic>GENERATION</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>RADER, William</creatorcontrib><creatorcontrib>PULLEN, Stuart</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>RADER, William</au><au>PULLEN, Stuart</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS</title><date>2017-12-06</date><risdate>2017</risdate><abstract>In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the replica transistor. A differential amplifier provides a level shifted differential replica voltage to a tap of a resistor ladder of a successive approximation register analog-to-digital converter in response to the sampled voltage across the replica transistor. A current source provides a current to a top of the resistor ladder.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP3250933A1
source esp@cenet
subjects APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS
BASIC ELECTRONIC CIRCUITRY
CODE CONVERSION IN GENERAL
CODING
CONTROL OR REGULATION THEREOF
CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER
CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
DECODING
ELECTRICITY
GENERATION
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T19%3A55%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=RADER,%20William&rft.date=2017-12-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3250933A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true