CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS
In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the rep...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | RADER, William PULLEN, Stuart |
description | In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the replica transistor. A differential amplifier provides a level shifted differential replica voltage to a tap of a resistor ladder of a successive approximation register analog-to-digital converter in response to the sampled voltage across the replica transistor. A current source provides a current to a top of the resistor ladder. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3250933A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3250933A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3250933A13</originalsourceid><addsrcrecordid>eNqNyrEKwjAQgOEsDqK-Q14goAYHx3Be40HNhUsaupUicRIt1PdHBR_A6R_-b6kKsAhCJg4aSKCjnHTDolMHgClRQeNiFO7p4r7KCHpKGUW74Fr2JrM5kafsWg0cCsrnpbVa3Mb7XDe_rpRuMMPZ1Ok51Hkar_VRXwNGuz9sj9a6nf2DvAGdtDEb</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS</title><source>esp@cenet</source><creator>RADER, William ; PULLEN, Stuart</creator><creatorcontrib>RADER, William ; PULLEN, Stuart</creatorcontrib><description>In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the replica transistor. A differential amplifier provides a level shifted differential replica voltage to a tap of a resistor ladder of a successive approximation register analog-to-digital converter in response to the sampled voltage across the replica transistor. A current source provides a current to a top of the resistor ladder.</description><language>eng ; fre ; ger</language><subject>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS ; BASIC ELECTRONIC CIRCUITRY ; CODE CONVERSION IN GENERAL ; CODING ; CONTROL OR REGULATION THEREOF ; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER ; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ; DECODING ; ELECTRICITY ; GENERATION ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2017</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171206&DB=EPODOC&CC=EP&NR=3250933A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20171206&DB=EPODOC&CC=EP&NR=3250933A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>RADER, William</creatorcontrib><creatorcontrib>PULLEN, Stuart</creatorcontrib><title>CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS</title><description>In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the replica transistor. A differential amplifier provides a level shifted differential replica voltage to a tap of a resistor ladder of a successive approximation register analog-to-digital converter in response to the sampled voltage across the replica transistor. A current source provides a current to a top of the resistor ladder.</description><subject>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CODE CONVERSION IN GENERAL</subject><subject>CODING</subject><subject>CONTROL OR REGULATION THEREOF</subject><subject>CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER</subject><subject>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</subject><subject>DECODING</subject><subject>ELECTRICITY</subject><subject>GENERATION</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQgOEsDqK-Q14goAYHx3Be40HNhUsaupUicRIt1PdHBR_A6R_-b6kKsAhCJg4aSKCjnHTDolMHgClRQeNiFO7p4r7KCHpKGUW74Fr2JrM5kafsWg0cCsrnpbVa3Mb7XDe_rpRuMMPZ1Ok51Hkar_VRXwNGuz9sj9a6nf2DvAGdtDEb</recordid><startdate>20171206</startdate><enddate>20171206</enddate><creator>RADER, William</creator><creator>PULLEN, Stuart</creator><scope>EVB</scope></search><sort><creationdate>20171206</creationdate><title>CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS</title><author>RADER, William ; PULLEN, Stuart</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3250933A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2017</creationdate><topic>APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CODE CONVERSION IN GENERAL</topic><topic>CODING</topic><topic>CONTROL OR REGULATION THEREOF</topic><topic>CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER</topic><topic>CONVERSION OR DISTRIBUTION OF ELECTRIC POWER</topic><topic>DECODING</topic><topic>ELECTRICITY</topic><topic>GENERATION</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>RADER, William</creatorcontrib><creatorcontrib>PULLEN, Stuart</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>RADER, William</au><au>PULLEN, Stuart</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS</title><date>2017-12-06</date><risdate>2017</risdate><abstract>In one embodiment, a correction circuit comprises circuit comprises a replica transistor biased at a current density to match that of a high side transistor of an output power switch at a specific load. A sample and hold circuit is coupled to the replica transistor to sample a voltage across the replica transistor. A differential amplifier provides a level shifted differential replica voltage to a tap of a resistor ladder of a successive approximation register analog-to-digital converter in response to the sampled voltage across the replica transistor. A current source provides a current to a top of the resistor ladder.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; fre ; ger |
recordid | cdi_epo_espacenet_EP3250933A1 |
source | esp@cenet |
subjects | APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC,OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWERSUPPLY SYSTEMS BASIC ELECTRONIC CIRCUITRY CODE CONVERSION IN GENERAL CODING CONTROL OR REGULATION THEREOF CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUTPOWER CONVERSION OR DISTRIBUTION OF ELECTRIC POWER DECODING ELECTRICITY GENERATION MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | CORRECTION CIRCUITS FOR SUCCESSIVE-APPROXIMATION-REGISTER ANALOG-TO-DIGITAL CONVERTERS |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T19%3A55%3A04IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=RADER,%20William&rft.date=2017-12-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3250933A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |