RAMAN SPECTROSCOPY MICROSCOPE AND METHOD FOR OBSERVING RAMAN SCATTERING

In a Raman spectroscopic microscope, a spatial resolution that exceeds the diffraction limit of light is achieved. A diffraction grating (2) diffracts laser light (L) emitted from a light source (1) and thereby generates diffracted light. A spectroscope (4) acquires a spectrum of incident light and...

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Bibliographische Detailangaben
Hauptverfasser:	FUJITA, Katsumasa, WATANABE, Kozue, KAWATA, Satoshi
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	COLORIMETRY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING
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Beschreibung
Zusammenfassung:	In a Raman spectroscopic microscope, a spatial resolution that exceeds the diffraction limit of light is achieved. A diffraction grating (2) diffracts laser light (L) emitted from a light source (1) and thereby generates diffracted light. A spectroscope (4) acquires a spectrum of incident light and a spatial distribution of light intensities of the spectrum. An optical system (3) applies interference light formed by +1st order diffracted light and -1st order diffracted light generated in the diffraction grating (2) to an object to be observed (10) as linear illumination light (LL) and guides a Raman scattered light (Lr) generated by the application of the linear illumination light (LL) to the object to be observed (10) to the spectroscope (4), the linear illumination light (LL) having its longitudinal direction in a first direction. A control unit (5) controls the optical system (3) and thereby scans the object to be observed (10) by the linear illumination light (LL) in a second direction.