METHOD FOR TESTING A HIGH-POWER SEMICONDUCTOR ELEMENT

METHOD FOR TESTING A HIGH-POWER SEMICONDUCTOR ELEMENT

A method for testing a high-power semiconductor element (11) of power converters of the high-voltage direct current transmission by means of a test circuit (20) comprising a number of voltage-regulated power converter modules (16) switched in series which can be connected to the primary side of a hi...

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Hauptverfasser: HAHN, Christoph, NEUBERT, Rolf, WEINDL, Christian, LUTHER, Matthias, SEMEROW, Anatoli, WENDLER, Thomas
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator HAHN, Christoph
NEUBERT, Rolf
WEINDL, Christian
LUTHER, Matthias
SEMEROW, Anatoli
WENDLER, Thomas
description A method for testing a high-power semiconductor element (11) of power converters of the high-voltage direct current transmission by means of a test circuit (20) comprising a number of voltage-regulated power converter modules (16) switched in series which can be connected to the primary side of a high-current transformer (9) and in which the secondary side of the high-current transformer (9) can be connected to the high-power semiconductor element (1), should enable a high-current test of a high-power semiconductor element by means of a described test circuit at a particularly high service life of the components used. For this purpose, the voltage-regulated power converter modules (16) are switched in a temporal phase of a test cycle into an undefined state.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title METHOD FOR TESTING A HIGH-POWER SEMICONDUCTOR ELEMENT
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