STANDING WAVE INTERFEROMETRIC MICROSCOPE
A wide-field interferometric microscope comprising: - A specimen holder, for holding a specimen at an analysis location; - An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light; - A pair of projection systems, arranged at opposite sides of s...
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| creator | Daum, Rainer Vögele, Xaver |
| description | A wide-field interferometric microscope comprising:
- A specimen holder, for holding a specimen at an analysis location;
- An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light;
- A pair of projection systems, arranged at opposite sides of said analysis location, to collect at least a portion of said fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, where they optically interfere;
- A detector arrangement, for examining output light from said combining element, wherein:
- The illuminator is configured to produce a standing wave of input radiation at the analysis location
- The detector arrangement comprises exactly two interferometric detection branches. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3159729B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3159729B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3159729B13</originalsourceid><addsrcrecordid>eNrjZNAIDnH0c_H0c1cIdwxzVfD0C3ENcnMN8vd1DQnydFbw9XQO8g929g9w5WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BxoamluZGlk6GxkQoAQDkTSQS</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>STANDING WAVE INTERFEROMETRIC MICROSCOPE</title><source>esp@cenet</source><creator>Daum, Rainer ; Vögele, Xaver</creator><creatorcontrib>Daum, Rainer ; Vögele, Xaver</creatorcontrib><description>A wide-field interferometric microscope comprising:
- A specimen holder, for holding a specimen at an analysis location;
- An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light;
- A pair of projection systems, arranged at opposite sides of said analysis location, to collect at least a portion of said fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, where they optically interfere;
- A detector arrangement, for examining output light from said combining element, wherein:
- The illuminator is configured to produce a standing wave of input radiation at the analysis location
- The detector arrangement comprises exactly two interferometric detection branches.</description><language>eng ; fre ; ger</language><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230823&DB=EPODOC&CC=EP&NR=3159729B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20230823&DB=EPODOC&CC=EP&NR=3159729B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Daum, Rainer</creatorcontrib><creatorcontrib>Vögele, Xaver</creatorcontrib><title>STANDING WAVE INTERFEROMETRIC MICROSCOPE</title><description>A wide-field interferometric microscope comprising:
- A specimen holder, for holding a specimen at an analysis location;
- An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light;
- A pair of projection systems, arranged at opposite sides of said analysis location, to collect at least a portion of said fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, where they optically interfere;
- A detector arrangement, for examining output light from said combining element, wherein:
- The illuminator is configured to produce a standing wave of input radiation at the analysis location
- The detector arrangement comprises exactly two interferometric detection branches.</description><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAIDnH0c_H0c1cIdwxzVfD0C3ENcnMN8vd1DQnydFbw9XQO8g929g9w5WFgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BxoamluZGlk6GxkQoAQDkTSQS</recordid><startdate>20230823</startdate><enddate>20230823</enddate><creator>Daum, Rainer</creator><creator>Vögele, Xaver</creator><scope>EVB</scope></search><sort><creationdate>20230823</creationdate><title>STANDING WAVE INTERFEROMETRIC MICROSCOPE</title><author>Daum, Rainer ; Vögele, Xaver</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3159729B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2023</creationdate><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Daum, Rainer</creatorcontrib><creatorcontrib>Vögele, Xaver</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Daum, Rainer</au><au>Vögele, Xaver</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>STANDING WAVE INTERFEROMETRIC MICROSCOPE</title><date>2023-08-23</date><risdate>2023</risdate><abstract>A wide-field interferometric microscope comprising:
- A specimen holder, for holding a specimen at an analysis location;
- An illuminator, for illuminating the specimen with input radiation, so as to cause it to emit fluorescence light;
- A pair of projection systems, arranged at opposite sides of said analysis location, to collect at least a portion of said fluorescence light and direct a corresponding pair of light beams into a respective pair of inputs of an optical combining element, where they optically interfere;
- A detector arrangement, for examining output light from said combining element, wherein:
- The illuminator is configured to produce a standing wave of input radiation at the analysis location
- The detector arrangement comprises exactly two interferometric detection branches.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS |
| title | STANDING WAVE INTERFEROMETRIC MICROSCOPE |
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