METHOD AND SYSTEM FOR MEASURING A SENSOR

The present disclosure concerns a method and apparatus for measuring a sensor (10) comprising multiple optical resonators (11,12) optically connected to a single optical output interface (16). The optical resonators (11,12) are interrogated with a light input signal (Si). A light output signal (So)...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	van Neer, Paul Louis Maria Joseph, Harmsma, Peter Johan, de Boer, Bart Michiel
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING
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