SURFACE-PLASMON ENHANCED FLUORESCENCE MEASUREMENT METHOD AND SURFACE-PLASMON ENHANCED FLUORESCENCE MEASUREMENT DEVICE
First, an analytical chip having a prism, a metal film that includes a trapping region having immobilized on the surface thereof a trapping element for trapping a substance to be analyzed, and a mark in which the scatter of emitted plasmon scattered light differs from the scatter of plasmon scattere...
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| creator | OKUMURA, Yoshihiro MATSUO, Masataka NODA, Tetsuya HIRAYAMA, Hiroshi HAMANO, Yoshimasa |
| description | First, an analytical chip having a prism, a metal film that includes a trapping region having immobilized on the surface thereof a trapping element for trapping a substance to be analyzed, and a mark in which the scatter of emitted plasmon scattered light differs from the scatter of plasmon scattered light emitted from the surrounding region, is disposed in a chip holder. Next, the rear surface of the metal film is irradiated with excitation light, plasmon scattered light emitted from the proximity of the mark is detected, and, on the basis of the detected plasmon scattered light, location information for the trap region is obtained. Next, the portion of the rear surface of the metal film that corresponds to the trap region arranged at the detected location is irradiated with excitation light, and fluorescence emitted by a fluorescent substance is detected. |
| format | Patent |
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Next, the rear surface of the metal film is irradiated with excitation light, plasmon scattered light emitted from the proximity of the mark is detected, and, on the basis of the detected plasmon scattered light, location information for the trap region is obtained. 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Next, the rear surface of the metal film is irradiated with excitation light, plasmon scattered light emitted from the proximity of the mark is detected, and, on the basis of the detected plasmon scattered light, location information for the trap region is obtained. 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Next, the rear surface of the metal film is irradiated with excitation light, plasmon scattered light emitted from the proximity of the mark is detected, and, on the basis of the detected plasmon scattered light, location information for the trap region is obtained. Next, the portion of the rear surface of the metal film that corresponds to the trap region arranged at the detected location is irradiated with excitation light, and fluorescence emitted by a fluorescent substance is detected.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | SURFACE-PLASMON ENHANCED FLUORESCENCE MEASUREMENT METHOD AND SURFACE-PLASMON ENHANCED FLUORESCENCE MEASUREMENT DEVICE |
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