PHASE SHIFTER CHIP RADIO FREQUENCY SELF-TEST
A method (300) includes selecting a first output (262, 262a) from a phased locked loop (260) and sending the first output from the phased locked loop to a first device under test (214, 214a) and a second device under test (214, 214b). The method includes adjusting a first phase rotator (226, 226a) c...
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creator | FELDMAN, Arnold R MOSSAWIR, Benjamin Joseph |
description | A method (300) includes selecting a first output (262, 262a) from a phased locked loop (260) and sending the first output from the phased locked loop to a first device under test (214, 214a) and a second device under test (214, 214b). The method includes adjusting a first phase rotator (226, 226a) connected to the first device under test to a first rotator phase value (228, 228a) of zero. The method includes determining a collection of phase detector values (252) of a phase detector (250) connected to the second device under test by adjusting a second phase rotator (226, 226b) connected to the second device under test to sweep through a phase range. The method includes measuring the phase detector values of the phase detector, and determining a phase detector gain (254) of the phase detector by averaging the collection of phase detector values and storing the phase detector gain. |
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The method includes adjusting a first phase rotator (226, 226a) connected to the first device under test to a first rotator phase value (228, 228a) of zero. The method includes determining a collection of phase detector values (252) of a phase detector (250) connected to the second device under test by adjusting a second phase rotator (226, 226b) connected to the second device under test to sweep through a phase range. 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The method includes adjusting a first phase rotator (226, 226a) connected to the first device under test to a first rotator phase value (228, 228a) of zero. The method includes determining a collection of phase detector values (252) of a phase detector (250) connected to the second device under test by adjusting a second phase rotator (226, 226b) connected to the second device under test to sweep through a phase range. The method includes measuring the phase detector values of the phase detector, and determining a phase detector gain (254) of the phase detector by averaging the collection of phase detector values and storing the phase detector gain.</description><subject>ANTENNAS, i.e. RADIO AERIALS</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TOANOTHER</subject><subject>ELECTRIC COMMUNICATION TECHNIQUE</subject><subject>ELECTRICITY</subject><subject>TRANSMISSION</subject><subject>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2017</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAJ8HAMdlUI9vB0C3ENUnD28AxQCHJ08fRXcAtyDQx19XOOVAh29XHTDXENDuFhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuAcaGRhZmBpaOhsZEKAEARgUktw</recordid><startdate>20170208</startdate><enddate>20170208</enddate><creator>FELDMAN, Arnold R</creator><creator>MOSSAWIR, Benjamin Joseph</creator><scope>EVB</scope></search><sort><creationdate>20170208</creationdate><title>PHASE SHIFTER CHIP RADIO FREQUENCY SELF-TEST</title><author>FELDMAN, Arnold R ; MOSSAWIR, Benjamin Joseph</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3128609A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2017</creationdate><topic>ANTENNAS, i.e. RADIO AERIALS</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TOANOTHER</topic><topic>ELECTRIC COMMUNICATION TECHNIQUE</topic><topic>ELECTRICITY</topic><topic>TRANSMISSION</topic><topic>TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION</topic><toplevel>online_resources</toplevel><creatorcontrib>FELDMAN, Arnold R</creatorcontrib><creatorcontrib>MOSSAWIR, Benjamin Joseph</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>FELDMAN, Arnold R</au><au>MOSSAWIR, Benjamin Joseph</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PHASE SHIFTER CHIP RADIO FREQUENCY SELF-TEST</title><date>2017-02-08</date><risdate>2017</risdate><abstract>A method (300) includes selecting a first output (262, 262a) from a phased locked loop (260) and sending the first output from the phased locked loop to a first device under test (214, 214a) and a second device under test (214, 214b). The method includes adjusting a first phase rotator (226, 226a) connected to the first device under test to a first rotator phase value (228, 228a) of zero. The method includes determining a collection of phase detector values (252) of a phase detector (250) connected to the second device under test by adjusting a second phase rotator (226, 226b) connected to the second device under test to sweep through a phase range. The method includes measuring the phase detector values of the phase detector, and determining a phase detector gain (254) of the phase detector by averaging the collection of phase detector values and storing the phase detector gain.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | ANTENNAS, i.e. RADIO AERIALS BASIC ELECTRIC ELEMENTS BASIC ELECTRONIC CIRCUITRY DEMODULATION OR TRANSFERENCE OF MODULATION FROM ONE CARRIER TOANOTHER ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY TRANSMISSION TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHICCOMMUNICATION |
title | PHASE SHIFTER CHIP RADIO FREQUENCY SELF-TEST |
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