IMAGING SYSTEM WITH CONTROLLABLE LINEAR POLARISATION
A light source (11, 30, 40) having first and second wire-grid polarizers (63, 64) and a laser (31, 71) that emits a beam of linearly polarized light that is characterized by a propagation direction is disclosed. The first wire-grid polarization filter (63) is characterized by a first linear polariza...
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| creator | Han, Yang Bricker, Dower Cameron Tella, Richard P Kleczewski, Adam |
| description | A light source (11, 30, 40) having first and second wire-grid polarizers (63, 64) and a laser (31, 71) that emits a beam of linearly polarized light that is characterized by a propagation direction is disclosed. The first wire-grid polarization filter (63) is characterized by a first linear polarization pass direction and a first actuator (65) for causing the first linear polarization pass direction to rotate relative to the beam of linearly polarized light. The second wire-grid polarization filter (64) is characterized by a second linear polarization pass direction and a second actuator for causing the second linear polarization pass direction to rotate relative to the beam of linearly polarized light. A controller (29) sets the first and second linear polarization pass directions to provide linearly polarized light having a specified polarization direction. |
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| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3125019B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3125019B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3125019B13</originalsourceid><addsrcrecordid>eNrjZDDx9HV09_RzVwiODA5x9VUI9wzxUHD29wsJ8vfxcXTycVXw8fRzdQxSCPD3cQzyDHYM8fT342FgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BxoZGpgaGlk6GxkQoAQCZwic9</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>IMAGING SYSTEM WITH CONTROLLABLE LINEAR POLARISATION</title><source>esp@cenet</source><creator>Han, Yang ; Bricker, Dower Cameron ; Tella, Richard P ; Kleczewski, Adam</creator><creatorcontrib>Han, Yang ; Bricker, Dower Cameron ; Tella, Richard P ; Kleczewski, Adam</creatorcontrib><description>A light source (11, 30, 40) having first and second wire-grid polarizers (63, 64) and a laser (31, 71) that emits a beam of linearly polarized light that is characterized by a propagation direction is disclosed. The first wire-grid polarization filter (63) is characterized by a first linear polarization pass direction and a first actuator (65) for causing the first linear polarization pass direction to rotate relative to the beam of linearly polarized light. The second wire-grid polarization filter (64) is characterized by a second linear polarization pass direction and a second actuator for causing the second linear polarization pass direction to rotate relative to the beam of linearly polarized light. A controller (29) sets the first and second linear polarization pass directions to provide linearly polarized light having a specified polarization direction.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; COLORIMETRY ; DEVICES USING STIMULATED EMISSION ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; RADIATION PYROMETRY ; TESTING</subject><creationdate>2021</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210113&DB=EPODOC&CC=EP&NR=3125019B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20210113&DB=EPODOC&CC=EP&NR=3125019B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Han, Yang</creatorcontrib><creatorcontrib>Bricker, Dower Cameron</creatorcontrib><creatorcontrib>Tella, Richard P</creatorcontrib><creatorcontrib>Kleczewski, Adam</creatorcontrib><title>IMAGING SYSTEM WITH CONTROLLABLE LINEAR POLARISATION</title><description>A light source (11, 30, 40) having first and second wire-grid polarizers (63, 64) and a laser (31, 71) that emits a beam of linearly polarized light that is characterized by a propagation direction is disclosed. The first wire-grid polarization filter (63) is characterized by a first linear polarization pass direction and a first actuator (65) for causing the first linear polarization pass direction to rotate relative to the beam of linearly polarized light. The second wire-grid polarization filter (64) is characterized by a second linear polarization pass direction and a second actuator for causing the second linear polarization pass direction to rotate relative to the beam of linearly polarized light. A controller (29) sets the first and second linear polarization pass directions to provide linearly polarized light having a specified polarization direction.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>COLORIMETRY</subject><subject>DEVICES USING STIMULATED EMISSION</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>RADIATION PYROMETRY</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2021</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDDx9HV09_RzVwiODA5x9VUI9wzxUHD29wsJ8vfxcXTycVXw8fRzdQxSCPD3cQzyDHYM8fT342FgTUvMKU7lhdLcDApuriHOHrqpBfnxqcUFicmpeakl8a4BxoZGpgaGlk6GxkQoAQCZwic9</recordid><startdate>20210113</startdate><enddate>20210113</enddate><creator>Han, Yang</creator><creator>Bricker, Dower Cameron</creator><creator>Tella, Richard P</creator><creator>Kleczewski, Adam</creator><scope>EVB</scope></search><sort><creationdate>20210113</creationdate><title>IMAGING SYSTEM WITH CONTROLLABLE LINEAR POLARISATION</title><author>Han, Yang ; Bricker, Dower Cameron ; Tella, Richard P ; Kleczewski, Adam</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3125019B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2021</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>COLORIMETRY</topic><topic>DEVICES USING STIMULATED EMISSION</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>RADIATION PYROMETRY</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Han, Yang</creatorcontrib><creatorcontrib>Bricker, Dower Cameron</creatorcontrib><creatorcontrib>Tella, Richard P</creatorcontrib><creatorcontrib>Kleczewski, Adam</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Han, Yang</au><au>Bricker, Dower Cameron</au><au>Tella, Richard P</au><au>Kleczewski, Adam</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMAGING SYSTEM WITH CONTROLLABLE LINEAR POLARISATION</title><date>2021-01-13</date><risdate>2021</risdate><abstract>A light source (11, 30, 40) having first and second wire-grid polarizers (63, 64) and a laser (31, 71) that emits a beam of linearly polarized light that is characterized by a propagation direction is disclosed. The first wire-grid polarization filter (63) is characterized by a first linear polarization pass direction and a first actuator (65) for causing the first linear polarization pass direction to rotate relative to the beam of linearly polarized light. The second wire-grid polarization filter (64) is characterized by a second linear polarization pass direction and a second actuator for causing the second linear polarization pass direction to rotate relative to the beam of linearly polarized light. A controller (29) sets the first and second linear polarization pass directions to provide linearly polarized light having a specified polarization direction.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS COLORIMETRY DEVICES USING STIMULATED EMISSION ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS RADIATION PYROMETRY TESTING |
| title | IMAGING SYSTEM WITH CONTROLLABLE LINEAR POLARISATION |
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